[图书][B] VLSI test principles and architectures: design for testability
This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …
design a testable and quality product, drive down test cost, improve product quality and …
A dual-mode built-in self-test technique for capacitive MEMS devices
X Xiong, YL Wu, WB Jone - IEEE Transactions on …, 2005 - ieeexplore.ieee.org
A dual-mode built-in self-test (BIST) scheme which partitions the fixed (instead of movable)
capacitance plates of a capacitive microelectromechanical system (MEMS) device is …
capacitance plates of a capacitive microelectromechanical system (MEMS) device is …
Generation of electrically induced stimuli for MEMS self-test
A major task for the implementation of Built-In-Self-Test (BIST) strategies for MEMS is the
generation of the test stimuli. These devices can work in different energy domains and are …
generation of the test stimuli. These devices can work in different energy domains and are …
Electrically induced stimuli for MEMS self-test
A major problem for applying self-test techniques to MEMS is the multi-domain nature of the
sensing parts that require special test equipment for stimuli generation. In this work we …
sensing parts that require special test equipment for stimuli generation. In this work we …
Fault modeling and fault simulation in mixed micro-fluidic microelectronic systems
HG Kerkhoff, HPA Hendriks - Journal of electronic testing, 2001 - Springer
Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include …
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include …
Multi-modal built-in self-test for symmetric microsystems
N Deb, RD Blanton - 22nd IEEE VLSI Test Symposium, 2004 …, 2004 - ieeexplore.ieee.org
A mathematical model analyzing the efficacy of a built-in self-test technique, applicable to
any symmetrical MEMS microstructure, is developed. The model predicts that the BIST …
any symmetrical MEMS microstructure, is developed. The model predicts that the BIST …
Using neural networks as a fault detection mechanism in MEMS devices
R Asgary, K Mohammadi, M Zwolinski - Microelectronics Reliability, 2007 - Elsevier
Micro Electro Mechanical Systems (MEMS) were first proposed about 20 years ago. Today,
many different kinds have been fabricated and are used in industry, space and scientific …
many different kinds have been fabricated and are used in industry, space and scientific …
Fault simulation and modelling of microelectromechanical systems
R Rosing, A Lechner, A Richardson, A Dorey - Computing & Control …, 2000 - IET
High-reliability and safety-critical markets for microelectromechanical systems are driving
new proposals for the integration of efficient built-in test and monitoring functions. The …
new proposals for the integration of efficient built-in test and monitoring functions. The …
[PDF][PDF] A fault simulation methodology for MEMS
R Rosing, AM Richardson, AP Dorey - … on Design, automation and test in …, 2000 - dl.acm.org
Efficient built-in and external test strategies are becoming essential in
MicroElectroMechanical Systems (MEMS), especially for high reliability and safety critical …
MicroElectroMechanical Systems (MEMS), especially for high reliability and safety critical …
Generation of component level fault models for MEMS
R Rosing, R Reichenbach, A Richardson - Microelectronics journal, 2002 - Elsevier
Component level (nodal) simulations have been proposed to both implement closed loop
simulation of complete microsystems to support the migration to shorter design cycles and …
simulation of complete microsystems to support the migration to shorter design cycles and …