[图书][B] Fundamentals of tunnel field-effect transistors
During the last decade, there has been a great deal of interest in TFETs. To the best authors'
knowledge, no book on TFETs currently exists. The proposed book provides readers with …
knowledge, no book on TFETs currently exists. The proposed book provides readers with …
A barrier controlled charge plasma-based TFET with gate engineering for ambipolar suppression and RF/linearity performance improvement
To address the fabrication complexity and cost of nanoscale devices, a dual material control
gate charge-plasma-based tunnel FET (DMCG-CPTFET) is presented for the first time for the …
gate charge-plasma-based tunnel FET (DMCG-CPTFET) is presented for the first time for the …
Reduction of TFET OFF-current and subthreshold swing by lightly doped drain
J Wu, Y Taur - IEEE Transactions on Electron Devices, 2016 - ieeexplore.ieee.org
This brief models the effect of lightly doped drain on the I ds-V gs and I ds-V ds
characteristics of tunnel FETs. It is shown that an extended drain depletion region can …
characteristics of tunnel FETs. It is shown that an extended drain depletion region can …
An analytical model of gate-all-around heterojunction tunneling FET
Y Guan, Z Li, W Zhang, Y Zhang… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
A compact analytical drain current model considering the inversion layer and source
depletion is developed for the gate-all-around (GAA) heterojunction tunneling FET (H-TFET) …
depletion is developed for the gate-all-around (GAA) heterojunction tunneling FET (H-TFET) …
A charge-based capacitance model for double-gate tunnel FETs with closed-form solution
B Lu, H Lu, Y Zhang, Y Zhang, X Cui… - … on Electron Devices, 2017 - ieeexplore.ieee.org
Based on an analytical surface potential and a simple mathematical approximation for the
source depletion width, a physics-based capacitance model with closed form for silicon …
source depletion width, a physics-based capacitance model with closed form for silicon …
An accurate and full-range analytical current model for nanowire heterojunction TFET
Y Guan, Z Dou, J Lu, S Huang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
In this article, we present a compact analytical model for the drain current of the nanowire
heterojunction tunneling field-effect transistor (FET). The model is developed by leveraging …
heterojunction tunneling field-effect transistor (FET). The model is developed by leveraging …
Performance investigation of gate engineered tri-gate SOI TFETs with different high-K dielectric materials for low power applications
In this article, a three-dimensional model of Tri-gate Tunnel Filed effect transistors (TFET)
with different gate materials is proposed. Analysis and comparison of various structures such …
with different gate materials is proposed. Analysis and comparison of various structures such …
Low frequency noise in tunneling field effect transistors
ST Bu, DM Huang, GF Jiao, HY Yu, MF Li - Solid-State Electronics, 2017 - Elsevier
An analytical model is developed for the fluctuation of the electrostatic potential induced by a
charged trap in the gate oxide in tunneling field effect transistor (TFET). The model is applied …
charged trap in the gate oxide in tunneling field effect transistor (TFET). The model is applied …
A continuous compact DC model for dual-independent-gate FinFETs
M Hasan, PE Gaillardon… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
Multiple-independent-gate (MIG) silicon FinFETs were recently shown capable of enabling:
1) device-level polarity control; 2) dynamic threshold modulation; and 3) subthreshold slope …
1) device-level polarity control; 2) dynamic threshold modulation; and 3) subthreshold slope …
Analysis of current mirror circuits designed with line tunnel FET devices at different temperatures
MDV Martino, JA Martino, PGD Agopian… - Semiconductor …, 2017 - iopscience.iop.org
The goal of this work is to study the performance of current mirror circuits designed with line
tunnel field effect transistor (TFET) devices and compare the suitability of this technology …
tunnel field effect transistor (TFET) devices and compare the suitability of this technology …