A review of interferometry for geometric measurement
S Yang, G Zhang - Measurement Science and Technology, 2018 - iopscience.iop.org
As high-precision measuring instruments have developed, interferometers have been widely
applied in the measurement of lengths and of the shape of surfaces, with nanometer …
applied in the measurement of lengths and of the shape of surfaces, with nanometer …
Development of surface reconstruction algorithms for optical interferometric measurement
D Wu, F Fang - Frontiers of Mechanical Engineering, 2021 - Springer
Optical interferometry is a powerful tool for measuring and characterizing areal surface
topography in precision manufacturing. A variety of instruments based on optical …
topography in precision manufacturing. A variety of instruments based on optical …
Improved vertical-scanning interferometry
A Harasaki, J Schmit, JC Wyant - Applied optics, 2000 - opg.optica.org
We describe a method that combines phase-shifting and coherence-peak-sensing
techniques to permit measurements with the height resolution of phase-shifting …
techniques to permit measurements with the height resolution of phase-shifting …
Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry
SW Kim, GH Kim - Applied Optics, 1999 - opg.optica.org
White-light scanning interferometry is increasingly used for precision profile metrology of
engineering surfaces, but its current applications are limited primarily to opaque surfaces …
engineering surfaces, but its current applications are limited primarily to opaque surfaces …
Wavelet transform as a processing tool in white-light interferometry
P Sandoz - Optics letters, 1997 - opg.optica.org
Results of the application of wavelet transform for signal processing in white-light
interferometry are reported. The mother wavelet frequency is chosen to be the light-source …
interferometry are reported. The mother wavelet frequency is chosen to be the light-source …
Determination of fringe order in white-light interference microscopy
P de Groot, X Colonna de Lega, J Kramer… - Applied …, 2002 - opg.optica.org
Combining phase and coherence information for improved precision in white-light
interference microscopy requires a robust strategy for dealing with the inconsistencies …
interference microscopy requires a robust strategy for dealing with the inconsistencies …
Fringe modulation skewing effect in white-light vertical scanning interferometry
A Harasaki, JC Wyant - Applied optics, 2000 - opg.optica.org
An interference fringe modulation skewing effect in white-light vertical scanning
interferometry that can produce a batwings artifact in a step height measurement is …
interferometry that can produce a batwings artifact in a step height measurement is …
Coherence scanning interferometry
P De Groot - Optical measurement of surface topography, 2011 - Springer
Height-dependent variations in fringe visibility related to optical coherence in an interference
microscope provide a powerful, non-contact sensing mechanism for 3D measurement and …
microscope provide a powerful, non-contact sensing mechanism for 3D measurement and …
Surface recovery algorithm in white light interferometry based on combined white light phase shifting and fast Fourier transform algorithms
Quality control of micro–nano structured and freeform surfaces is becoming increasingly
important, which leads to challenging requirements in the measurement and …
important, which leads to challenging requirements in the measurement and …
Characterization of the static and dynamic behaviour of M (O) EMS by optical techniques: status and trends
A Bosseboeuf, S Petitgrand - Journal of micromechanics and …, 2003 - iopscience.iop.org
Optical techniques which were developed for ex situ characterization of static
displacements, motions, vibrations and internal strain of micromechanical devices and M (O) …
displacements, motions, vibrations and internal strain of micromechanical devices and M (O) …