A review of interferometry for geometric measurement

S Yang, G Zhang - Measurement Science and Technology, 2018 - iopscience.iop.org
As high-precision measuring instruments have developed, interferometers have been widely
applied in the measurement of lengths and of the shape of surfaces, with nanometer …

Development of surface reconstruction algorithms for optical interferometric measurement

D Wu, F Fang - Frontiers of Mechanical Engineering, 2021 - Springer
Optical interferometry is a powerful tool for measuring and characterizing areal surface
topography in precision manufacturing. A variety of instruments based on optical …

Improved vertical-scanning interferometry

A Harasaki, J Schmit, JC Wyant - Applied optics, 2000 - opg.optica.org
We describe a method that combines phase-shifting and coherence-peak-sensing
techniques to permit measurements with the height resolution of phase-shifting …

Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

SW Kim, GH Kim - Applied Optics, 1999 - opg.optica.org
White-light scanning interferometry is increasingly used for precision profile metrology of
engineering surfaces, but its current applications are limited primarily to opaque surfaces …

Wavelet transform as a processing tool in white-light interferometry

P Sandoz - Optics letters, 1997 - opg.optica.org
Results of the application of wavelet transform for signal processing in white-light
interferometry are reported. The mother wavelet frequency is chosen to be the light-source …

Determination of fringe order in white-light interference microscopy

P de Groot, X Colonna de Lega, J Kramer… - Applied …, 2002 - opg.optica.org
Combining phase and coherence information for improved precision in white-light
interference microscopy requires a robust strategy for dealing with the inconsistencies …

Fringe modulation skewing effect in white-light vertical scanning interferometry

A Harasaki, JC Wyant - Applied optics, 2000 - opg.optica.org
An interference fringe modulation skewing effect in white-light vertical scanning
interferometry that can produce a batwings artifact in a step height measurement is …

Coherence scanning interferometry

P De Groot - Optical measurement of surface topography, 2011 - Springer
Height-dependent variations in fringe visibility related to optical coherence in an interference
microscope provide a powerful, non-contact sensing mechanism for 3D measurement and …

Surface recovery algorithm in white light interferometry based on combined white light phase shifting and fast Fourier transform algorithms

Q Vo, F Fang, X Zhang, H Gao - Applied optics, 2017 - opg.optica.org
Quality control of micro–nano structured and freeform surfaces is becoming increasingly
important, which leads to challenging requirements in the measurement and …

Characterization of the static and dynamic behaviour of M (O) EMS by optical techniques: status and trends

A Bosseboeuf, S Petitgrand - Journal of micromechanics and …, 2003 - iopscience.iop.org
Optical techniques which were developed for ex situ characterization of static
displacements, motions, vibrations and internal strain of micromechanical devices and M (O) …