Methods for depositing Group 13 metal or metalloid nitride films

X Lei, M Kim, SV Ivanov - US Patent 10,745,808, 2020 - Google Patents
Described herein are methods for forming a Group 13 metal or metalloid nitride film. In one
aspect, there is provided a method of forming an aluminum nitride film comprising the steps …

Investigation and review of the thermal, mechanical, electrical, optical, and structural properties of atomic layer deposited high-k dielectrics: Beryllium oxide, aluminum …

JT Gaskins, PE Hopkins, DR Merrill… - ECS Journal of Solid …, 2017 - iopscience.iop.org
Atomic layer deposited (ALD) high-dielectric-constant (high-k) materials have found
extensive applications in a variety of electronic, optical, optoelectronic, and photovoltaic …

Chemical, optical, and electrical characterization of Ga2O3 thin films grown by plasma-enhanced atomic layer deposition

X Li, HL Lu, HP Ma, JG Yang, JX Chen, W Huang… - Current Applied …, 2019 - Elsevier
Thin Ga 2 O 3 films were grown on Si (100) using trimethylgallium (TMG) and oxygen as the
precursors through plasma-enhanced atomic layer deposition. The depositions were made …

Area-selective low-pressure thermal atomic layer deposition of aluminum nitride

BY van der Wel, K van der Zouw… - The Journal of …, 2023 - ACS Publications
This work demonstrates intrinsic area-selective deposition of AlN films by thermal atomic
layer deposition (ALD). Using sequential pulses of trimethylaluminum and NH3 at a …

Low-temperature one-step growth of AlON thin films with homogenous nitrogen-doping profile by plasma-enhanced atomic layer deposition

HY Chen, HL Lu, JX Chen, F Zhang, XM Ji… - … applied materials & …, 2017 - ACS Publications
The AlON film with homogeneous nitrogen-doping profile was grown by plasma-enhanced
atomic layer deposition (PEALD) at low temperature. In this work, the precursors of the NH3 …

Self-limiting growth and thickness-and temperature-dependence of optical constants of ALD AlN thin films

H Van Bui, MD Nguyen, FB Wiggers… - ECS journal of solid …, 2014 - iopscience.iop.org
We have investigated the growth characteristics and optical constants of thin AlN films made
by thermal atomic layer deposition (ALD) from trimethylaluminum (TMA) and ammonia (NH …

[图书][B] Passive silicon photonics devices

Y Su, Y Zhang - 2022 - pubs.aip.org
Passive Silicon Photonic Devices: Design, Fabrication, and TestingPassive Silicon Photonic
Devices: Design, Fabrication, and Tes Page 1 Meth ods Passive Silicon Photonic Devices …

A study of the structural and surface morphology and photoluminescence of ni-doped aln thin films grown by co-sputtering

M Khan, GA Nowsherwan, AA Shah, S Riaz, M Riaz… - Nanomaterials, 2022 - mdpi.com
Aluminum nitride (AlN) is a semiconductor material possessing a hexagonal wurtzite crystal
structure with a large band gap of 6.2 eV. AlN thin films have several potential applications …

Epitaxial growth of excitonic single crystals and heterostructures: Oxides and nitrides

P Rajpoot, A Ghosh, A Kaur, S Arora, M Henini, S Dhar… - MRS Bulletin, 2024 - Springer
Excitons in a semiconductor are Coulomb interaction-bound pairs of excited electrons in the
conduction band and holes in the valence band, which can either be free bosonic particles …

Preparation and properties of AlN (aluminum nitride) powder/thin films by single source precursor

H Chaurasia, SK Tripathi, K Bilgaiyan… - New Journal of …, 2019 - pubs.rsc.org
The aluminum nitride (AlN) powder/thin films were prepared from an aluminum–urea
complex. The complex, hexa urea aluminate (III) chloride, has proven to be a potential single …