A Novel DTSCR Structure with High Holding Voltage and Enhanced Current Discharge Capability for 28 nm CMOS Technology ESD Protection

Z Han, S Chen, H Liu, S Wang, B Ma, R Chen, X Fu - Micromachines, 2023 - mdpi.com
To cope with the much narrower ESD design window in 28 nm CMOS technology, a novel
diode-triggered silicon-controlled rectifier with an extra discharge path (EDP-DTSCR) for …

[HTML][HTML] Ultra-Low-Voltage-Triggered Silicon Controlled Rectifier ESD Protection Device for 2.5 V Nano Integrated Circuit

R Chen, H Wei, H Liu, Z Liu, Y Chen - Nanomaterials, 2022 - mdpi.com
In this paper, an improved low-voltage-triggered silicon-controlled rectifier (LVTSCR) called
an ultra-low-voltage-triggered SCR (ULVTSCR) is proposed and fabricated in a 40-nm …

Effect of P-type Guard ring on the Turn-on Characteristics of Diode-triggered SCR

F Du, Z Liu, JJ Liou - 2019 8th International Symposium on …, 2019 - ieeexplore.ieee.org
In this paper, the influence of inner p-type guard ring (PGR) on the triggering characteristics
of diode-triggered silicon-controlled rectifier (DTSCR) is studied. The ESD characteristics of …

[引用][C] 一种低触发电压的两级防护SCR 器件

张英韬, 朱治华, 范晓梅, 毛盼, 宋彬, 许杞安, 吴铁将… - 微电子学, 2022