Etch selectivity during plasma-assisted etching of SiO2 and SiNx: Transitioning from reactive ion etching to atomic layer etching

RJ Gasvoda, Z Zhang, S Wang, EA Hudson… - Journal of Vacuum …, 2020 - pubs.aip.org
Continued downscaling of semiconductor devices has placed stringent constraints on all
aspects of the fabrication process including plasma-assisted anisotropic etching. To address …

Progress and prospects in nanoscale dry processes: How can we control atomic layer reactions?

K Ishikawa, K Karahashi, T Ichiki… - Japanese Journal of …, 2017 - iopscience.iop.org
In this review, we discuss the progress of emerging dry processes for nanoscale fabrication.
Experts in the fields of plasma processing have contributed to addressing the increasingly …

Towards atomic and close-to-atomic scale manufacturing

F Fang, N Zhang, D Guo, K Ehmann… - … Journal of Extreme …, 2019 - iopscience.iop.org
Human beings have witnessed unprecedented developments since the 1760s using
precision tools and manufacturing methods that have led to ever-increasing precision, from …

Integrated Isothermal Atomic Layer Deposition/Atomic Layer Etching Supercycles for Area-Selective Deposition of TiO2

SK Song, H Saare, GN Parsons - Chemistry of Materials, 2019 - ACS Publications
New approaches for area-selective deposition (ASD) are becoming critical for advanced
semiconductor patterning. Atomic layer deposition (ALD) and atomic layer etching (ALE) …

[HTML][HTML] Fluorocarbon based atomic layer etching of Si3N4 and etching selectivity of SiO2 over Si3N4

C Li, D Metzler, CS Lai, EA Hudson… - Journal of Vacuum …, 2016 - pubs.aip.org
Angstrom-level plasma etching precision is required for semiconductor manufacturing of sub-
10 nm critical dimension features. Atomic layer etching (ALE), achieved by a series of self …

Atomic layer etching of 3D structures in silicon: Self-limiting and nonideal reactions

CM Huard, Y Zhang, S Sriraman, A Paterson… - Journal of Vacuum …, 2017 - pubs.aip.org
Current (and future) microelectronics fabrication requirements place unprecedented
demands on the fidelity of plasma etching. As device features shrink to atomic dimensions …

Surface damage formation during atomic layer etching of silicon with chlorine adsorption

EJC Tinacba, M Isobe, S Hamaguchi - Journal of Vacuum Science & …, 2021 - pubs.aip.org
As semiconductor device structures continue to approach the nanometer size range, new
challenges in the fabrication of such devices have arisen. For example, the need for high …

Plasma processing for advanced microelectronics beyond CMOS

N Marchack, L Buzi, DB Farmer, H Miyazoe… - Journal of Applied …, 2021 - pubs.aip.org
The scientific study of plasma discharges and their material interactions has been crucial to
the development of semiconductor process engineering and, by extension, the entire …

[HTML][HTML] Characterizing fluorocarbon assisted atomic layer etching of Si using cyclic Ar/C4F8 and Ar/CHF3 plasma

D Metzler, C Li, S Engelmann, RL Bruce… - The Journal of …, 2017 - pubs.aip.org
With the increasing interest in establishing directional etching methods capable of atomic
scale resolution for fabricating highly scaled electronic devices, the need for development …

Molecular dynamics simulation of Si trench etching with SiO2 hard masks

NA Mauchamp, S Hamaguchi - … of Vacuum Science & Technology A, 2022 - pubs.aip.org
Molecular dynamics simulations were performed to demonstrate nanometer-scale silicon (⁠
Si⁠) trench etching with silicon dioxide (⁠ SiO 2⁠) hard masks by chlorine (⁠ Cl+⁠) ion …