Quantitative prediction of ion-induced single-event transients in an operational amplifier using a quasi-bessel beam pulsed-laser approach

JM Hales, A Ildefonso, SP Buchner… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
A recently mymargin developed pulsed-laser (PL) testing approach, which uses a quasi-
Bessel beam (QBB) to better emulate a heavy-ion charge profile, is employed to predict the …

SPICE simulations of single event transients in bipolar analog integrated circuits using public information and free open source tools

FJ Franco, C Palomar, JG Izquierdo… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
This paper proposes a technique to build SPICE micromodels of integrated circuits in bipolar
technology appropriate to simulate single event transients. First of all, we will show how to …

Heuristic Detection of the Most Vulnerable Regions in Electronic Devices for Radiation Survivability

SP Stepanoff, MAJ Rasel, A Haque… - ECS Journal of Solid …, 2022 - iopscience.iop.org
As electronic systems become larger and more complex, detection of the most vulnerable
regions (MVR) to radiation exposure becomes more difficult and time consuming. We …

Comparative study on the transients induced by single event effect and space electrostatic discharge

R Chen, L Chen, S Li, X Zhu… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Space radiation-induced Single Event Effect (SEE) and Space Electrostatic Discharge
(SESD) are two significant phenomena which cause spacecraft anomalies. However, it is …

The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier

F Roig, L Dusseau, P Ribeiro, G Auriel… - … on Nuclear Science, 2014 - ieeexplore.ieee.org
The influence of external circuit designs on ASET shapes in a high speed current feedback
amplifier (CFA)(AD844) is investigated by means of the pulsed laser single event effect …

Analysis of single event transients in arbitrary waveforms using statistical window analysis

JL Carpenter, TN Peyton, BR Dean… - … on Nuclear Science, 2023 - ieeexplore.ieee.org
Window or taper functions are commonly used in data processing to detect transient events
or for time-averaging of frequency spectra. A generalized window function is demonstrated …

A single-event transient hardened LDO regulator with built-in filter

Z Duan, Y Ding, C Lu, Z Zhao, J Hu… - IEICE Electronics …, 2015 - jstage.jst.go.jp
A single-event transient (SET) hardened LDO using novel structure is proposed to enhance
the single-event effect tolerance. The novel LDO with built-in filter can mitigate the response …

Peak detector effect in low-dropout regulators

C Palomar, FJ Franco, I López-Calle… - … on Nuclear Science, 2013 - ieeexplore.ieee.org
The peak detector effect is a phenomenon that makes single event transients much longer
once an error amplifier switches from linear to saturation zone due to the presence of …

Impact of cumulative irradiation degradation and circuit board design on the parameters of ASETs induced in discrete BJT-based circuits

NJH Roche, A Khachatrian, SP Buchner… - … on Nuclear Science, 2015 - ieeexplore.ieee.org
Circuit parameters and configuration are very important when studying the synergistic effects
total dose/SET. We explore a method combining dynamic parameter measurement and …

Method of Single Event Effects Radiation Hardened Design for DC-DC Converter Based Load Transient Detection

Z Guo, N Liu, H Lu, M Li, Z Qiu - Chinese Journal of Electronics, 2024 - ieeexplore.ieee.org
Aiming at the impact of load current change on single-event transient, the essential
difference between single-event transient and load transient of DC-DC converter is deeply …