Quantitative prediction of ion-induced single-event transients in an operational amplifier using a quasi-bessel beam pulsed-laser approach
JM Hales, A Ildefonso, SP Buchner… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
A recently mymargin developed pulsed-laser (PL) testing approach, which uses a quasi-
Bessel beam (QBB) to better emulate a heavy-ion charge profile, is employed to predict the …
Bessel beam (QBB) to better emulate a heavy-ion charge profile, is employed to predict the …
SPICE simulations of single event transients in bipolar analog integrated circuits using public information and free open source tools
FJ Franco, C Palomar, JG Izquierdo… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
This paper proposes a technique to build SPICE micromodels of integrated circuits in bipolar
technology appropriate to simulate single event transients. First of all, we will show how to …
technology appropriate to simulate single event transients. First of all, we will show how to …
Heuristic Detection of the Most Vulnerable Regions in Electronic Devices for Radiation Survivability
As electronic systems become larger and more complex, detection of the most vulnerable
regions (MVR) to radiation exposure becomes more difficult and time consuming. We …
regions (MVR) to radiation exposure becomes more difficult and time consuming. We …
Comparative study on the transients induced by single event effect and space electrostatic discharge
Space radiation-induced Single Event Effect (SEE) and Space Electrostatic Discharge
(SESD) are two significant phenomena which cause spacecraft anomalies. However, it is …
(SESD) are two significant phenomena which cause spacecraft anomalies. However, it is …
The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier
F Roig, L Dusseau, P Ribeiro, G Auriel… - … on Nuclear Science, 2014 - ieeexplore.ieee.org
The influence of external circuit designs on ASET shapes in a high speed current feedback
amplifier (CFA)(AD844) is investigated by means of the pulsed laser single event effect …
amplifier (CFA)(AD844) is investigated by means of the pulsed laser single event effect …
Analysis of single event transients in arbitrary waveforms using statistical window analysis
JL Carpenter, TN Peyton, BR Dean… - … on Nuclear Science, 2023 - ieeexplore.ieee.org
Window or taper functions are commonly used in data processing to detect transient events
or for time-averaging of frequency spectra. A generalized window function is demonstrated …
or for time-averaging of frequency spectra. A generalized window function is demonstrated …
A single-event transient hardened LDO regulator with built-in filter
Z Duan, Y Ding, C Lu, Z Zhao, J Hu… - IEICE Electronics …, 2015 - jstage.jst.go.jp
A single-event transient (SET) hardened LDO using novel structure is proposed to enhance
the single-event effect tolerance. The novel LDO with built-in filter can mitigate the response …
the single-event effect tolerance. The novel LDO with built-in filter can mitigate the response …
Peak detector effect in low-dropout regulators
C Palomar, FJ Franco, I López-Calle… - … on Nuclear Science, 2013 - ieeexplore.ieee.org
The peak detector effect is a phenomenon that makes single event transients much longer
once an error amplifier switches from linear to saturation zone due to the presence of …
once an error amplifier switches from linear to saturation zone due to the presence of …
Impact of cumulative irradiation degradation and circuit board design on the parameters of ASETs induced in discrete BJT-based circuits
NJH Roche, A Khachatrian, SP Buchner… - … on Nuclear Science, 2015 - ieeexplore.ieee.org
Circuit parameters and configuration are very important when studying the synergistic effects
total dose/SET. We explore a method combining dynamic parameter measurement and …
total dose/SET. We explore a method combining dynamic parameter measurement and …
Method of Single Event Effects Radiation Hardened Design for DC-DC Converter Based Load Transient Detection
Z Guo, N Liu, H Lu, M Li, Z Qiu - Chinese Journal of Electronics, 2024 - ieeexplore.ieee.org
Aiming at the impact of load current change on single-event transient, the essential
difference between single-event transient and load transient of DC-DC converter is deeply …
difference between single-event transient and load transient of DC-DC converter is deeply …