Analysis of single-event upsets and transients in 22 nm fully depleted silicon-on-insulator logic
JV D'Amico, ST Vibbert, AC Watkins… - … on Nuclear Science, 2023 - ieeexplore.ieee.org
In this work, single-event upset (SEU) and single-event transient (SET) responses of digital
logic in a planar 22 nm conventional-well fully depleted silicon-on-insulator (FD-SOI) …
logic in a planar 22 nm conventional-well fully depleted silicon-on-insulator (FD-SOI) …