Stability, reliability, and robustness of GaN power devices: A review

JP Kozak, R Zhang, M Porter, Q Song… - … on Power Electronics, 2023 - ieeexplore.ieee.org
Gallium nitride (GaN) devices are revolutionarily advancing the efficiency, frequency, and
form factor of power electronics. However, the material composition, architecture, and …

Wide band gap devices and their application in power electronics

A Kumar, M Moradpour, M Losito, WT Franke… - Energies, 2022 - mdpi.com
Power electronic systems have a great impact on modern society. Their applications target a
more sustainable future by minimizing the negative impacts of industrialization on the …

Demonstration of 4.7 kV breakdown voltage in NiO/β-Ga2O3 vertical rectifiers

JS Li, CC Chiang, X Xia, TJ Yoo, F Ren, H Kim… - Applied Physics …, 2022 - pubs.aip.org
Vertical heterojunction NiO/β n-Ga 2 O/n+ Ga 2 O 3 rectifiers employing NiO layer extension
beyond the rectifying contact for edge termination exhibit breakdown voltages (VB) up to 4.7 …

Formation and Applications in Electronic Devices of Lattice‐Aligned Gallium Oxynitride Nanolayer on Gallium Nitride

J Chen, J Zhao, S Feng, L Zhang, Y Cheng… - Advanced …, 2023 - Wiley Online Library
Gallium nitride (GaN), a promising alternative semiconductor to Si, is widely used in
photoelectronic and electronic technologies. However, the vulnerability of the GaN surface is …

Degradation and recovery of GaN HEMTs in overvoltage hard switching near breakdown voltage

JP Kozak, Q Song, R Zhang, Y Ma, J Liu… - … on Power Electronics, 2022 - ieeexplore.ieee.org
GaN high electron mobility transistors (HEMTs) have limited avalanche capability and
usually fail catastrophically in voltage overshoot up to their dynamic breakdown voltage (BV …

Improved crystal quality and enhanced optical performance of GaN enabled by ion implantation induced high-quality nucleation

H Tao, S Xu, J Zhang, H Su, Y Gao, Y Zhang… - Optics …, 2023 - opg.optica.org
Hetero-epitaxial growth of GaN often leads to high density of threading dislocations, which
poses a significant challenge to the promotion of the performance of GaN-based devices. In …

Gallium Nitride Power Devices in Power Electronics Applications: State of Art and Perspectives

S Musumeci, V Barba - Energies, 2023 - mdpi.com
High-electron-mobility transistors based on gallium nitride technology are the most recently
developed power electronics devices involved in power electronics applications. This article …

Power electronics revolutionized: A comprehensive analysis of emerging wide and ultrawide bandgap devices

SMSH Rafin, R Ahmed, MA Haque, MK Hossain… - Micromachines, 2023 - mdpi.com
This article provides a comprehensive review of wide and ultrawide bandgap power
electronic semiconductor devices, comparing silicon (Si), silicon carbide (SiC), gallium …

Output capacitance loss of GaN HEMTs in steady-state switching

Q Song, R Zhang, Q Li, Y Zhang - IEEE Transactions on Power …, 2023 - ieeexplore.ieee.org
The output capacitance () loss, a loss produced when the device's output capacitor is
charged and discharged, has become a concern for GaN high electron mobility transistors …

Power device breakdown mechanism and characterization: Review and perspective

R Zhang, Y Zhang - Japanese Journal of Applied Physics, 2023 - iopscience.iop.org
Breakdown voltage (BV) is arguably one of the most critical parameters for power devices.
While avalanche breakdown is prevailing in silicon and silicon carbide devices, it is lacking …