A state of the art on ADC modelling
The state of the art of the research on modelling of analog-to-digital converter (ADC)-based
measuring devices is surveyed. Main topics of modelling are reviewed according to the …
measuring devices is surveyed. Main topics of modelling are reviewed according to the …
Combined spectral and histogram analysis for fast ADC testing
The integral nonlinearity (INL) of analog-to-digital converters (ADCs) can be described by a
behavioral error model expressed as one-dimensional image in the code domain. This …
behavioral error model expressed as one-dimensional image in the code domain. This …
Application of the combined method for the estimation of the RMS measurement error caused by ADC nonlinearity
AN Serov, NA Serov… - 2019 42nd International …, 2019 - ieeexplore.ieee.org
Currently, digital methods are applied to measure the root mean square (RMS) of the signal
in most cases. To obtain instantaneous values of the input signal in digital form, an analog-to …
in most cases. To obtain instantaneous values of the input signal in digital form, an analog-to …
Evaluation of the Effect of Nonlinearity of the Successive Approximation ADC to the Measurement Error of RMS
AN Serov, NA Serov… - … Symposium on Industrial …, 2018 - ieeexplore.ieee.org
Currently, the digital measurement methods are most often used to measure the root mean
square (RMS) value of a signal. Among the digital measurement methods, the most popular …
square (RMS) value of a signal. Among the digital measurement methods, the most popular …
Unified ADC nonlinearity error model for SAR ADC
L Michaeli, P Michalko, J Šaliga - Measurement, 2008 - Elsevier
The paper introduces a new ADC static nonlinearity model focusing on SAR ADC which is
labelled the unified ADC nonlinearity error model. The model can also cover any other ADC …
labelled the unified ADC nonlinearity error model. The model can also cover any other ADC …
A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
P Arpaia, AM da Cruz Serra… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
In recent gears, the IEEE 1057-93 Standard (1994) for specifying and testing measurement
devices based on analog-to-digital converters (ADCs) earned scientific interest in several …
devices based on analog-to-digital converters (ADCs) earned scientific interest in several …
A baseline wander tracking system for artifact rejection in long-term electrocardiography
T Niederhauser, L Kohler, A Haeberlin… - IEEE transactions on …, 2015 - ieeexplore.ieee.org
Long-term electrocardiogram (ECG) signals might suffer from relevant baseline disturbances
during physical activity. Motion artifacts in particular are more pronounced with dry surface …
during physical activity. Motion artifacts in particular are more pronounced with dry surface …
Formation of the ηc in Two-Photon Collisions at LEP
M Acciarri, P Achard, O Adriani, M Aguilar-Benitez… - Physics Letters B, 1999 - Elsevier
The two-photon width Γγγ of the ηc meson has been measured with the L3 detector at LEP.
The ηc is studied in the decay modes π+ π− π+ π−, π+ π− K+ K−, K0sK±π∓, K+ K− π0, π+ …
The ηc is studied in the decay modes π+ π− π+ π−, π+ π− K+ K−, K0sK±π∓, K+ K− π0, π+ …
A dynamic error model for integrating analog-to-digital converters
Integrating analog-to-digital converters (IADCs) basically include an analog signal
processing section for conditioning and integrating the input signal, and a quantizing section …
processing section for conditioning and integrating the input signal, and a quantizing section …
[图书][B] Modeling, identification, and compensation of channel mismatch errors in time-interleaved analog-to-digital converters
C Vogel - 2005 - academia.edu
Modern signal processing applications emerging in telecommunication and instrumentation
industries need high-speed analog-to-digital converters (ADCs), which can be achieved by …
industries need high-speed analog-to-digital converters (ADCs), which can be achieved by …