Investigation of the size-dependent dynamic characteristics of atomic force microscope microcantilevers based on the modified couple stress theory
In this paper, the resonant frequency and sensitivity of atomic force microscope (AFM)
microcantilevers are studied using the modified couple stress theory. The classical …
microcantilevers are studied using the modified couple stress theory. The classical …
Atomic force acoustic microscopy
U Rabe - Applied scanning probe methods II: scanning probe …, 2006 - Springer
Materials with an artificial nanostructure such as nanocrystalline metals and ceramics or
matrix embedded nanowires or nanoparticles are advancing into application. Polymer …
matrix embedded nanowires or nanoparticles are advancing into application. Polymer …
Micromachined atomic force microscopy sensor with integrated piezoresistive sensor and thermal bimorph actuator for high-speed tapping-mode atomic force …
R Pedrak, T Ivanov, K Ivanova, T Gotszalk… - Journal of Vacuum …, 2003 - pubs.aip.org
This article describes microprobes for noncontact scanning force microscopy that make use
of a direct-oscillating thermally driven bimorph actuator with integrated piezoresistive …
of a direct-oscillating thermally driven bimorph actuator with integrated piezoresistive …
Measurement of elastic modulus of nanotubes by resonant contact atomic force microscopy
S Cuenot, C Frétigny… - Journal of applied …, 2003 - pubs.aip.org
A resonant contact atomic force microscopy technique is used to quantitatively measure the
elastic modulus of polymer nanotubes. An oscillating electric field is applied between the …
elastic modulus of polymer nanotubes. An oscillating electric field is applied between the …
[HTML][HTML] Nanoscale ultrasonic subsurface imaging with atomic force microscopy
Imaging of subsurface features down to the nanometer scale is of great importance in
various fields such as microelectronics, materials science, nanobiology, and nanomedicine …
various fields such as microelectronics, materials science, nanobiology, and nanomedicine …
Contact resonance force microscopy techniques for nanomechanical measurements
Contact resonance force microscopy (CR-FM) methods such as atomic force acoustic
microscopy show great promise as tools for nanoscale materials research. However …
microscopy show great promise as tools for nanoscale materials research. However …
PERTS: A prototyping environment for real-time systems
JWS Liu, CL Liu, Z Deng, TS Tia, J Sun… - … Journal of Software …, 1996 - World Scientific
This paper describes PERTS, a prototyping environment for real-time systems. PERTS
provides a comprehensive set of design, validation, and simulation tools that are built on …
provides a comprehensive set of design, validation, and simulation tools that are built on …
Sensitivity of flexural vibration mode of the rectangular atomic force microscope micro cantilevers in liquid to the surface stiffness variations
AF Payam - Ultramicroscopy, 2013 - Elsevier
In this paper, the resonance frequencies and modal sensitivity of flexural vibration modes of
a rectangular atomic force microscope (AFM) cantilever immersed in a liquid to surface …
a rectangular atomic force microscope (AFM) cantilever immersed in a liquid to surface …
Flexural vibration of an atomic force microscope cantilever based on modified couple stress theory
This paper is concerned with the flexural vibration of an atomic force microscope (AFM)
cantilever. The cantilever problem is formulated on the basis of the modified couple stress …
cantilever. The cantilever problem is formulated on the basis of the modified couple stress …
Effect of tip length and normal and lateral contact stiffness on the flexural vibration responses of atomic force microscope cantilevers
TS Wu, WJ Chang, JC Hsu - Microelectronic Engineering, 2004 - Elsevier
The resonant frequency and sensitivity of flexural vibration for an atomic force microscope
(AFM) cantilever have been analyzed. A closed-form expression for the sensitivity of …
(AFM) cantilever have been analyzed. A closed-form expression for the sensitivity of …