Semimetal-to-semiconductor transition in bismuth thin films

CA Hoffman, JR Meyer, FJ Bartoli, A Di Venere, XJ Yi… - Physical Review B, 1993 - APS
Field-and temperature-dependent magnetotransport measurements on Bi layers grown by
molecular-beam epitaxy have been analyzed by mixed-conduction techniques. In the thin …

Surface-sensitive conductance measurements

P Hofmann, JW Wells - Journal of Physics: Condensed Matter, 2008 - iopscience.iop.org
Several approaches for surface-sensitive conductance measurements are reviewed.
Particular emphasis is placed on nanoscale multi-point probe techniques. The results for two …

Large-area dry transfer of single-crystalline epitaxial bismuth thin films

ES Walker, SR Na, D Jung, SD March, JS Kim… - Nano …, 2016 - ACS Publications
We report the first direct dry transfer of a single-crystalline thin film grown by molecular beam
epitaxy. A double cantilever beam fracture technique was used to transfer epitaxial bismuth …

Low-temperature electrical-transport properties of single-crystal bismuth films under pressure

M Lu, RJ Zieve, A Van Hulst, HM Jaeger… - Physical Review B, 1996 - APS
We report an investigation of the low-temperature electrical transport properties of bismuth
films under applied hydrostatic pressure. Films with their trigonal axis perpendicular to the …

Quantum-size effects in n-type bismuth thin films

EI Rogacheva, SN Grigorov, ON Nashchekina… - Applied physics …, 2003 - pubs.aip.org
Oscillatory thickness dependences of the electrical conductivity, Hall coefficient, charge
carrier mobility, and Seebeck coefficient were obtained at room temperature for n-type thin …

Localized -electron magnetism in the semimetal

MO Ajeesh, SK Kushwaha, SM Thomas, JD Thompson… - Physical Review B, 2023 - APS
Ce 3 Bi 4 Au 3 crystallizes in the same noncentrosymmetric cubic structure as the
prototypical Kondo insulator Ce 3 Bi 4 Pt 3. Here we report the physical properties of Ce 3 Bi …

Semimetal–semiconductor transition in thin Bi films

EI Rogacheva, SG Lyubchenko, MS Dresselhaus - Thin Solid Films, 2008 - Elsevier
The temperature dependences of the Hall coefficient of thin bismuth films with thicknesses
d= 8 to 215 nm prepared by thermal evaporation in vacuum on mica substrates were …

The conductivity of Bi (111) investigated with nanoscale four point probes

JW Wells, K Handrup, JF Kallehauge… - Journal of Applied …, 2008 - pubs.aip.org
The room temperature conductance of Bi (111) was measured using microscopic four point
probes with a contact spacing down to 500 nm. The conductance is remarkably similar to …

Quantitative analysis of the weak anti-localization effect in ultrathin bismuth films

S Sangiao, N Marcano, J Fan, L Morellón… - Europhysics …, 2011 - iopscience.iop.org
Magnetic-field dependence of conductivity in ultrathin Bi films is measured in applied
magnetic fields up to 9 T, in both directions, perpendicular and parallel to the film plane, at …

Transition from Metal to Mott Insulator Controlled by Growth Conditions on CaRuO3 Ultrathin Films

M Sakoda, K Shinya - Journal of the Physical Society of Japan, 2023 - journals.jps.jp
In ultrathin films of nanometer-order thickness, which correspond to the Fermi wavelength,
novel quantum phenomena are observed because the electronic systems are restricted …