Integration of fault detection with run-to-run control

TP Reiss, AP Shanmugasundram… - US Patent …, 2008 - Google Patents
(*) Notice: Subject to any disclaimer, the term of this “A real-time equipment monitoring and
fault detection system'. patent is extended or adjusted under 35 Guo et al., Semiconductor …

Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities

AP Shanmugasundram, H Armer… - US Patent 7,082,345, 2006 - Google Patents
The invention relates to a method, system and computer program useful for producing a
product, such as a microelectronic device, for example in an assembly line, where the …

Generic interface builder

YT Chi, PCM Hawkins, Q Jin - US Patent 6,708,074, 2004 - Google Patents
Generic interface adapter builder softWare generates an US'PATENT DOCUMENTS
interface adapter to tie tools into a centralized manufacturing 3,205,485 A 9/1965 Noltingk …

Feedback control of plasma-enhanced chemical vapor deposition processes

AP Shanmugasundram, AT Schwarm… - US Patent …, 2005 - Google Patents
US6913938B2 - Feedback control of plasma-enhanced chemical vapor deposition processes
- Google Patents US6913938B2 - Feedback control of plasma-enhanced chemical vapor …

Multi-tool control system, method and medium

S Somekh, HE Grunes - US Patent 6,640,151, 2003 - Google Patents
A system/method for interactively monitoring and adjusting product output from a module
that includes two or more preparation tools. The output is a result of the coordinated effort of …

Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing

AP Shanmugasundram, AT Schwarm - US Patent 7,698,012, 2010 - Google Patents
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4,609,870 4,616,308 4,663,703 4,698,766 4,717,596 4,750,141 4,755,753 4,757,259 4,796 …

Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life

YJ Paik - US Patent 6,910,947, 2005 - Google Patents
ABSTRACT A method, apparatus and medium of conditioning a pla narizing Surface
includes installing a wafer to be polished in a chemical mechanical polishing (CMP) …

Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools

AT Schwarm - US Patent 7,333,871, 2008 - Google Patents
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Computer integrated manufacturing techniques

JF Arackaparambil, T Chi, B Chow, PM D'souza… - US Patent …, 2006 - Google Patents
The present invention provides a novel distributed factory system framework including a
novel factory automation lifecycle (200) having lifecycle activities for SW developing and …

System, method, and medium for monitoring performance of an advanced process control system

AT Schwarm - US Patent 7,356,377, 2008 - Google Patents
A method for monitoring performance of an advanced process control system for at least one
process output includes calculating a variance of a prediction error for a processing …