Fine-grained access management in reconfigurable scan networks
R Baranowski, MA Kochte… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Modern very large scale integration designs incorporate a high amount of instrumentation
that supports post-silicon validation and debug, volume test and diagnosis, as well as in …
that supports post-silicon validation and debug, volume test and diagnosis, as well as in …
Reconfigurable scan networks: Modeling, verification, and optimal pattern generation
Efficient access to on-chip instrumentation is a key requirement for post-silicon validation,
test, debug, bringup, and diagnosis. Reconfigurable scan networks, as proposed by, for …
test, debug, bringup, and diagnosis. Reconfigurable scan networks, as proposed by, for …
Access port protection for reconfigurable scan networks
Scan infrastructures based on IEEE Std. 1149.1 (JTAG), 1500 (SECT), and P1687 (IJTAG)
provide a cost-effective access mechanism for test, reconfiguration, and debugging …
provide a cost-effective access mechanism for test, reconfiguration, and debugging …
Synthesis of fault-tolerant reconfigurable scan networks
S Brandhofer, MA Kochte… - … Design, Automation & …, 2020 - ieeexplore.ieee.org
On-chip instrumentation is mandatory for efficient bring-up, test and diagnosis, post-silicon
validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable …
validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable …
[PDF][PDF] Security of data flow in IEEE Std 1687 reconfigurable scan networks.
P Raiola - 2022 - freidok.uni-freiburg.de
Moderne Fertigungstechnologien ermöglichen eine steigende Menge von Transistoren auf
begrenzter Chipfläche, wodurch effizient genutzte eingebettete Test-Infrastrukturen, auch …
begrenzter Chipfläche, wodurch effizient genutzte eingebettete Test-Infrastrukturen, auch …
[引用][C] Security of data flow in IEEE Std 1687 reconfigurable scan networks
P Raiola - Dissertation, Universität Freiburg …