Several instrumental imperfections of transmission electron microscopes are characterized
and their effects on the results of quantitative scanning electron microscopy (STEM) are …

The composition of GaAs measured by laser-assisted atom probe tomography may be
inaccurate depending on the experimental conditions. In this work, we assess the role of the …

Microscopy has played a central role in the advancement of nanoscience and
nanotechnology by enabling the direct visualization of nanoscale structure, leading to …

This paper presents a comprehensive investigation of an extended method to determine
composition of materials by scanning transmission electron microscopy (STEM) high angle …

Strain analyses from experimental series of nano-beam electron diffraction (NBED) patterns
in scanning transmission electron microscopy are performed for different specimen tilts …

The angle-resolved electron scattering is investigated in scanning-transmission electron
microscopy (STEM) using a motorised iris aperture placed above a conventional annular …

In this paper we perform angular resolved annular-dark field (ADF) scanning-transmission
electron microscopy (STEM) to study the scattered intensity in an InGaN layer buried in GaN …

We report a study of scattering dynamics in crystals employing momentum-resolved
scanning transmission electron microscopy under varying illumination conditions. As we …

Surface relaxation of thin transmission electron microscopy (TEM) specimens of strained
layers results in a severe bending of lattice planes. This bending significantly displaces …

If quantitative scanning transmission electron microscopy is used for very precise thickness
measurements with atomic resolution, it is commonly referred to as» atom counting «. Due to …