Aims: To clarify the decision-making and bereavement needs of family members who had
organ donation discussed with them; to provide a rationale for further preparation of …

One of the major challenges in testing a system-on-a-chip is dealing with the large volume of
test data. To reduce the volume of test data, several test data compression techniques have …

Test compaction is an important aspect in the post-production test since it is able to reduce
the test data and the test costs, respectively. Current automatic test pattern generation …

This study describes a static test compaction procedure that is applicable in the scenario
where (i) a large pool of tests can be generated efficiently, but (ii) test compaction that …

Distributed test data compression refers to the scenario where each logic block in a design
has its own decompression logic and compact set of compressed tests. A static test …

In a design that consists of several logic blocks, each logic block may be tested separately
using its own compressed test set and on-chip decompression logic. The decompression …

Test sets that consist of both broadside and skewed-load tests provide improved delay fault
coverage for standard-scan circuits. This paper describes a static test compaction procedure …

This work presents two new methods for the generation of test sets with a small number of
specified bits. Such type of test sets have been proven beneficial to a large number of test …

Both test compaction and test data compression methods provide an opportunity for a tester
to apply modified versions of each test, in addition to the original test. We take advantage of …

This paper describes a low-power test generation procedure, which targets the switching
activity during the fast functional clock cycles of broadside tests. The procedure is based on …