Mueller matrix ellipsometry (MME) provides the 4× 4 Mueller matrix of a sample under test,
which determines how the state of polarization is changed as light interacts with the sample …

Every month, many new software vulnerabilities are discovered and published which will
pose security risks to power grid systems if they are exploited by attackers. Thus the …

A high-speed Mueller matrix ellipsometer (MME) based on photoelastic modulator (PEM)
polarization modulation and division-of-amplitude polarization demodulation has been …

With the urgent demands of characterizing the optical properties and thicknesses of nano-
films in some micron-scale trenches usually emerging in integrated circuit manufacturing …

The simultaneous Stokes polarimetry (SSP) plays a crucial role in various fields, including
the characterization of suspended particles in air and water, as well as the measurement of …

Ellipsometry is a widely-used and highly-accurate method for characterizing materials and
thin films, though conventional ellipsometry restricts the geometric shape of samples to flat …

This paper presents a polarization-insensitive sandwiched three-port beam splitting grating
at normal incidence. The grating adopts a sandwiched structure. Based on the rigorous …

Circularly polarized (CP) emission can be achieved by integrating emissive materials into
chiral metasurfaces. Such CP light sources in integrated device platforms are desirable for …

In order to meet the requirements of dynamic monitoring from a bird's eye view for typical
rapidly changing processes such as mechanical rotation and photoresist exposure reaction …

A novel, to the best of our knowledge, optical method using a high-speed polarimetry is
proposed for real-time attitude tracking in an ultra-large measurement range. The attitude …