Analysis of SRAM metrics for data dependent BTI degradation and process variability
Abstract Bias Temperature Instability (BTI) is one of the most crucial reliability issues in
modern CMOS technology. It leads to shift in device parameters, which eventually affect …
modern CMOS technology. It leads to shift in device parameters, which eventually affect …
MECCA: A robust low-overhead PUF using embedded memory array
AR Krishna, S Narasimhan, X Wang… - … Hardware and Embedded …, 2011 - Springer
The generation of unique keys by Integrated Circuits (IC) has important applications in areas
such as Intellectual Property (IP) counter-plagiarism and embedded security integration. To …
such as Intellectual Property (IP) counter-plagiarism and embedded security integration. To …
Impacts of NBTI/PBTI on timing control circuits and degradation tolerant design in nanoscale CMOS SRAM
HI Yang, SC Yang, W Hwang… - IEEE Transactions on …, 2011 - ieeexplore.ieee.org
Negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI)
weaken PFET and NFET over the lifetime of usage, leading to performance and reliability …
weaken PFET and NFET over the lifetime of usage, leading to performance and reliability …
Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier
The CMOS technology scaling faced over the past recent decades severe variability and
reliability challenges. One of the major reliability challenges is bias temperature instability …
reliability challenges. One of the major reliability challenges is bias temperature instability …
Aging mitigation in memory arrays using self-controlled bit-flipping technique
With CMOS technology downscaling into the nanometer regime, the reliability of SRAM
memories is threatened by accelerated transistor aging mechanisms such as Bias …
memories is threatened by accelerated transistor aging mechanisms such as Bias …
Detecting malicious landing pages in malware distribution networks
Drive-by download attacks attempt to compromise a victim's computer through browser
vulnerabilities. Often they are launched from Malware Distribution Networks (MDNs) …
vulnerabilities. Often they are launched from Malware Distribution Networks (MDNs) …
Long-term continuous assessment of SRAM PUF and source of random numbers
The qualities of Physical Unclonable Functions (PUFs) suffer from several noticeable
degradations due to silicon aging. In this paper, we investigate the long-term effects of …
degradations due to silicon aging. In this paper, we investigate the long-term effects of …
Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops
The assessment of noise margins and the related probability of failure in digital cells has
growingly become essential, as nano-scale MOSFET and FinFET technologies are …
growingly become essential, as nano-scale MOSFET and FinFET technologies are …
Impact of NBTI aging on the single-event upset of SRAM cells
We analyzed the impact of negative bias temperature instability (NBTI) on the single-event
upset rate of SRAM cells through experiments and SPICE simulations. We performed critical …
upset rate of SRAM cells through experiments and SPICE simulations. We performed critical …
SRAM stability analysis for different cache configurations due to bias temperature instability and hot carrier injection
Bias Temperature Instability (BTI) and Hot Carrier Injections (HCI) are two of the main effects
that increase a transistor's threshold voltage and further cause performance degradations …
that increase a transistor's threshold voltage and further cause performance degradations …