This paper examines the performance degradation of a MOS device fabricated on silicon-on-
insulator (SOI) due to the undesirable short-channel effects (SCE) as the channel length is …

The goals and constraints of MOSFET scaling are reviewed, and the role of reliability
constraints is highlighted. It is concluded that judicial shrinking of MOSFET device …

Volume IV. The DUNE far detector single-phase technology - IOPscience This site uses
cookies. By continuing to use this site you agree to our use of cookies. To find out more, see …

Silicon-on-Insulator Technology: Materials to VLSI, Third Edition, retraces the evolution of
SOI materials, devices and circuits over a period of roughly twenty years. Twenty years of …

Today, micro-electronic circuits are undeniably and ubiquitously present in our society.
Transportation vehicles such as cars, trains, buses, and airplanes make abundant use of …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

From the Publisher: This book covers the design of next generation microprocessors in deep
submicron CMOS technologies. The chapters in Design of High Performance …

Metal Oxide Semiconductor (MOS) transistors are the basic building block ofMOS integrated
circuits (IC). Very Large Scale Integrated (VLSI) circuits using MOS technology have …

Short-channel effects in thin-film silicon-on-insulator (SOI) MOSFETs are shown to be
unique because of dependences on film thickness and body and back-gate (substrate) …

Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are the leading
reliability concerns for nanoscale transistors. The de facto modeling method to analyze CHC …