The signal generation mechanism of the scanning field-emission microscope has been
investigated via model calculations combining deterministic trajectory calculations in the …

The current flowing through a Mott spin junction depends on the relative spin orientation of
the two ferromagnetic layers comprising the “source” and “drain” sides of the junction. The …

We simulate the electronic system of ejected electrons arising when a tip, positioned few 10
nm away from a surface, is operated in the field emission regime. We find that, by repeated …

In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a
few tens of) nanometres distance from a surface (the collector) and biased to field-emit …

Electron spectroscopy proves to be a handy tool in material science. Combination of
electron spectroscopy and scanning probe microscopy is possible through Scanning Field …

The average transverse energy of field emission electrons at the cathode surface is one of
the key factors that determines the virtual source size, hence the transverse spatial …

Abstract In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-
target distance is few nanometers to few tens of nanometers. In this situation the tunneling …

When a scanning tunneling microscope is operated at tip-target distances ranging from few
nanometers to few tens of nanometers (Fowler-Nordheim or field emission regime), a new …

Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-
emission regime. Images of W (110)-surfaces with and without some carbon content are …

Results The spectra acquired using the CLAM and BBX are shown in Fig. 2. The conditions
used and results obtained are shown in Table 1. Each spectrum has been normalised to the …