Analog circuit design using tunnel-FETs

B Sedighi, XS Hu, H Liu, JJ Nahas… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
Tunnel-FET (TFET) is a major candidate for beyond-CMOS technologies. In this paper, the
properties of the TFETs that affect analog circuit design are studied. To demonstrate how …

Strained Si and SiGe nanowire tunnel FETs for logic and analog applications

QT Zhao, S Richter, C Schulte-Braucks… - IEEE Journal of the …, 2015 - ieeexplore.ieee.org
Guided by the Wentzel-Kramers–Brillouin approximation for band-to-band tunneling (BTBT),
various performance boosters for Si TFETs are presented and experimentally verified. Along …

Low-frequency noise analysis and modeling in vertical tunnel FETs with Ge source

FS Neves, PGD Agopian, JA Martino… - … on Electron Devices, 2016 - ieeexplore.ieee.org
This paper presents the low-frequency noise (LFN) behavior of vertical tunnel FETs (TFETs).
The experimental input characteristics with different source compositions (Si and Ge) and …

Sub-10 nm graphene nano-ribbon tunnel field-effect transistor

AMM Hammam, ME Schmidt, M Muruganathan… - Carbon, 2018 - Elsevier
We report a temperature independent subthreshold slope (SS) of∼ 47 mV/dec at low
temperature in a triple top gate graphene tunnel field-effect transistor (TFET). The outer …

Temperature dependence of analog performance, linearity, and harmonic distortion for a ge-source tunnel FET

E Datta, A Chattopadhyay, A Mallik… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
In this article, we report an investigation of the effects of variation in temperature in the range
of 300-450 K on the analog performance and harmonic distortion (HD) characteristics of a …

Study of line-TFET analog performance comparing with other TFET and MOSFET architectures

PG Der Agopian, JA Martino, A Vandooren… - Solid-State …, 2017 - Elsevier
In this work the Line-TFET performance is compared with MOSFET and Point-TFET devices,
with different architectures (FinFET and GAA: Gate-All-Around) at both room and high …

Radiation study of TFET and JLFET-based devices and circuits: a comprehensive review on the device structure and sensitivity

K Aishwarya, B Lakshmi - Radiation Effects and Defects in Solids, 2023 - Taylor & Francis
All electronic devices when used in a radiation environment undergo significant changes in
their electrical properties. It is interesting to explore the effects of radiation, not only on …

Influence of the source composition on the analog performance parameters of vertical nanowire-TFETs

PGD Agopian, MDV Martino… - … on Electron Devices, 2014 - ieeexplore.ieee.org
The goal of this paper is to study the analog performance parameters of tunnel field-effect
transistors (TFETs) with different source compositions and process conditions. The …

Temperature sensitivity analysis of inner-gate engineered JL-SiNT-FET: An Analog/RF prospective

S Tayal, V Mittal, S Jadav, S Gupta, A Nandi, B Krishan - Cryogenics, 2020 - Elsevier
This paper explores the temperature sensitivity of Inner-gate engineered junctionless silicon
nanotube FET (JL-SiNT-FET) on analog/RF performance. It is found that the reduction in the …

[HTML][HTML] Impact of deep cryogenic temperatures on gate stack dual material DG MOSFET performance: Analog and RF analysis

SK Das, SM Biswal, LI Giri, U Nanda - e-Prime-Advances in Electrical …, 2024 - Elsevier
By understanding the potential benefits of Gate Stack Dual Material double gate MOSFET
(DG MOSFET), this research aims to contribute to the investigation of its electrical …