Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

The present status and development of strong-field nano-optics, an emerging field of
nonlinear optics, is discussed. A nonperturbative regime of light-matter interactions is …

Abstract Two-dimensional (2D) van der Waals transition metal dichalcogenides (TMDs) are
a new class of electronic materials offering tremendous opportunities for advanced …

While FIB sample preparation for transmission electron microscopy is a well established
technique, few examples exist of samples of sufficient quality for atomic resolution imaging …

Using a fifth-order aberration-corrected scanning transmission electron microscope, which
provides a factor of 100 increase in signal over an uncorrected instrument, we demonstrated …

A new generation of electron microscopes is able to explore the microscopic properties of
materials and devices as diverse as transistors, turbine blades and interfacial …

Imaging at atomic resolution based on the inelastic scattering of electrons has become firmly
established in the last three decades. Harald Rose pioneered much of the early theoretical …

We show that an annular detector placed within the bright field cone in scanning
transmission electron microscopy allows direct imaging of light elements in crystals. In …

Abstract 2D transition metal dichalcogenides (TMDs) exhibit remarkable properties that are
strongly influenced by their atomic structures, as well as by various types of defects and …

Seventy-five years after its invention, transmission electron microscopy has taken a great
step forward with the introduction of aberration-corrected electron optics. An entirely new …