High-voltage CMOS active pixel sensor

I Perić, A Andreazza, H Augustin… - IEEE Journal of Solid …, 2021 - ieeexplore.ieee.org
The high-voltage CMOS (HVCMOS) sensors are a novel type of CMOS active pixel sensors
for ionizing particles that can be implemented in CMOS processes with deep n-well option …

SISSA: Acceptor removal-Displacement damage effects involving the shallow acceptor doping of p-type silicon devices

M Moll - PoS, 2020 - cds.cern.ch
New sensor technologies are under development to cope with the ever increasing
requirements for high energy physics (HEP) detectors. For the High-Luminosity LHC (HL …

Investigation of the Boron removal effect induced by 5.5 MeV electrons on highly doped EPI-and Cz-silicon

C Liao, E Fretwurst, E Garutti, J Schwandt… - Nuclear Instruments and …, 2023 - Elsevier
This study focuses on the properties of the B i O i (interstitial Boron–interstitial Oxygen) and
C i O i (interstitial Carbon–interstitial Oxygen) defect complexes by 5.5 MeV electrons in low …

The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon Diodes

C Liao, E Fretwurst, E Garutti… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
In this work, the thermally stimulated current (TSC) technique has been used to investigate
the properties of the radiation-induced interstitial boron and interstitial oxygen defect …

MuPix and ATLASPix--Architectures and Results

A Schöning, J Anders, H Augustin, M Benoit… - arXiv preprint arXiv …, 2020 - arxiv.org
High Voltage Monolithic Active Pixel Sensors (HV-MAPS) are based on a commercial High
Voltage CMOS process and collect charge by drift inside a reversely biased diode. HV …

[HTML][HTML] Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon—Electronic Properties of Configurational …

A Nitescu, C Besleaga, GA Nemnes, I Pintilie - Sensors, 2023 - mdpi.com
The acceptor removal process is the most detrimental effect encountered in irradiated boron-
doped silicon. This process is caused by a radiation-induced boron-containing donor (BCD) …

[HTML][HTML] Microscopic origin of the acceptor removal in neutron-irradiated Si detectors-An atomistic simulation study

P López, M Aboy, I Santos, LA Marqués, M Ullán… - Acta Materialia, 2022 - Elsevier
The improved radiation hardness of p-type Si detectors is hindered by the radiation-induced
acceptor removal process, which is not fully understood yet. Through atomistic modeling of …

Characterisation of analogue front end and time walk in CMOS active pixel sensor

B Hiti, V Cindro, A Gorišek, M Franks… - Journal of …, 2021 - iopscience.iop.org
In this work we investigated a method to determine time walk in an active silicon pixel sensor
prototype using Edge-TCT with infrared laser charge injection. Samples were investigated …

Progress on the radiation tolerance of CMOS Monolithic Active Pixel Sensors

M Deveaux - Journal of Instrumentation, 2019 - iopscience.iop.org
Abstract CMOS Monolithic Active Pixel Sensors (CPS) are ultra-light and highly granular
silicon pixel detectors suited for highly sensitive charged particle tracking. Being …

Recent depleted CMOS developments within the CERN-RD50 framework

E Vilella Figueras - Proceedings of The 28th …, 2020 - livrepository.liverpool.ac.uk
Depleted CMOS sensors are groundbreaking position sensitive detectors that offer a
competitive and cost-effective solution for a large range of particle tracking applications. In …