Electro-thermal analytical model and simulation of the self-heating effects in multi-finger 4H-SiC power MESFETs

X Deng, B Zhang, Z Li - Semiconductor science and technology, 2007 - iopscience.iop.org
Abstract A three-dimensional (3D) electro-thermal analytical model to accurately predict the
temperature distribution in multi-finger silicon carbide (SiC) based high-power field-effect …

Self-heating and destruction of high-voltage 4H-SiC rectifier diodes under a single short current surge pulse

ME Levinshtein, PA Ivanov, TT Mnatsakanov… - Solid-state …, 2008 - Elsevier
Self-heating of high-voltage (6kV class) 4H-SiC rectifier p+–n–n+ diodes under the action of
a single 20μs forward current surge pulse has been studied experimentally up to current …

Electrothermal transport in silicon carbide semiconductors via a hydrodynamic model

O Muscato, VD Stefano - SIAM Journal on Applied Mathematics, 2015 - SIAM
A hydrodynamic model describing the electron transport in silicon carbide semiconductors,
coupled with the heating of the crystal lattice, is presented. It has been obtained by taking …

Electro-thermal simulations of a microwave 4H-SiC MESFET on high purity semi-insulating substrate

H Hjelmgren, K Andersson, J Eriksson, PÅ Nilsson… - Solid-state …, 2007 - Elsevier
DC and small-signal electro-thermal simulations of a 4H-SiC microwave power MESFET on
a high purity semi-insulating substrate are compared to measurements. The focus is on the …

Self-heating and loss of thermal stability under a single current surge pulse in high-voltage 4H-SiC rectifier diodes

ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2008 - iopscience.iop.org
Self-heating and loss of thermal stability under the action of a single 8 ms current surge
pulse has been studied experimentally in high-voltage (6 kV class) 4H-SiC p+–n–n+ rectifier …

Channel temperature determination for AlGaN/GaN HEMTs on SiC and sapphire

JC Freeman, W Mueller - 2008 - ntrs.nasa.gov
Numerical simulation results (with emphasis on channel temperature) for a single gate
AlGaN/GaN High Electron Mobility Transistor (HEMT) with either a sapphire or SiC substrate …

Isothermal current–voltage characteristics of high-voltage silicon carbide rectifier p–i–n diodes at very high current densities

ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2007 - iopscience.iop.org
It is shown that, at high current densities corresponding to current surges, the isothermal
current–voltage characteristics of high-voltage silicon carbide diodes cannot, in principle, be …

Steady state self-heating and dc current–voltage characteristics of high-voltage 4H-SiC p+–n–n+ rectifier diodes

ME Levinshtein, TT Mnatsakanov, PA Ivanov… - Solid-state …, 2007 - Elsevier
Self-heating of high-voltage (10kV class) 4H-SiC rectifier p+–n–n+ diodes has been studied
experimentally and theoretically in the dc mode. An analytical model is suggested, which …

Novel TCAD-Oriented Definition of the off-State Breakdown Voltage in Schottky-Gate FETs: A 4H–SiC MESFET Case Study

M Furno, F Bonani, G Ghione - IEEE transactions on electron …, 2008 - ieeexplore.ieee.org
Physics-based breakdown voltage optimization in Schottky-barrier power RF and microwave
field-effect transistors as well as in high-speed power-switching diodes is today an important …

Моделирование тепловых режимов мощных GaN СВЧ транзисторов

АА Глыбин, КА Иванов, ВА Курмачёв… - … техника. Серия 2 …, 2012 - elibrary.ru
Проведён расчёт распределения температуры по поверхности кристаллов GaN СВЧ
транзисторов для гетероструктур AlGaN/GaN/SiC. Приведены данные по зависимости …