In the fast growing field of multifrequency atomic force microscopy (AFM), the benefits of
using higher order modes have been extensively reported on. However, higher modes of …

To facilitate further miniaturization of atomic force microscopy (AFM) cantilevers and to
eliminate the standard optical beam deflection sensor, integrated piezoelectric actuation and …

Nanotechnology has emerged as an integral technology for the study and manipulation of
matter on the atomic level. Over the past few decades, it has become increasingly relevant to …