Verification of spark-resistance formulae for micro-gap ESD
Y Taka, O Fujiwara - IEICE transactions on communications, 2010 - search.ieice.org
Micro-gap electrostatic discharge (ESD) events due to a human with charge voltages below
1000 V cause serious malfunctions in high-tech information devices. For clarifying such a …
1000 V cause serious malfunctions in high-tech information devices. For clarifying such a …
微小间隙静电放电中两种放电模式的影响研究
阮方鸣， 董墨， 吴亮， 王义， 周峰， 石丹， 高攸纲 - 电波科学学报, 2012 - cjors.cn
设计实验讨论了被普遍认为是空气放电的带电体与受电体有相对运动速度的静电放电的参数
变化性质. 由于电极最终要碰触到放电靶上, 所以, 同时考虑接触放电模式的影响 …
变化性质. 由于电极最终要碰触到放电靶上, 所以, 同时考虑接触放电模式的影响 …
ESD Generator Tip Current Reconstruction Using a Current Probe Measurement at the Ground Strap
Monitoring ESD generator discharge current during IEC 61000-4-2 testing helps to better
understand product failures. By acquiring the discharge waveform using an oscilloscope …
understand product failures. By acquiring the discharge waveform using an oscilloscope …
Verification of spark resistance formula for human ESD
Y Taka, O Fujiwara - 2008 Asia-Pacific Symposium on …, 2008 - ieeexplore.ieee.org
Short-gap electrostatic discharge (ESD) events due to charged moving-objects provide a
fatal electromagnetic failure to high-tech information equipment. For clarifying the …
fatal electromagnetic failure to high-tech information equipment. For clarifying the …
Further validation of spark-resistance formula applied for human ESD
Y Taka, O Fujiwara - 2009 20th International Zurich Symposium …, 2009 - ieeexplore.ieee.org
Micro-gap electrostatic discharge (ESD) events due to a human with charge voltages below
1000 V cause serious malfunctions in high-tech information devices. For clarifying such a …
1000 V cause serious malfunctions in high-tech information devices. For clarifying such a …
Distortion of ESD generator pulse due to limited bandwidth of verification path
J Baran, J Sroka - IEEE transactions on electromagnetic …, 2010 - ieeexplore.ieee.org
The paper deals with analysis of how limited bandwidth of a setup for verification of
electrostatic discharge (ESD) generators affects reliability of testing. It is investigated how …
electrostatic discharge (ESD) generators affects reliability of testing. It is investigated how …
Frequency approach to analysis of ESD pulse
J Baran, J Sroka - IEEJ Transactions on Fundamentals and Materials, 2012 - jstage.jst.go.jp
The paper concerns calibration of generators for simulation of the Human-Metal Electrostatic
Discharge (ESD) according to the IEC 61000-4-2 standard. It is shown that analysis of the …
Discharge (ESD) according to the IEC 61000-4-2 standard. It is shown that analysis of the …
Dependence of breakdown fields on charge voltages for human ESD
Y Taka, O Fujiwara - 2008 Asia-Pacific Symposium on …, 2008 - ieeexplore.ieee.org
Electrostatic discharge (ESD) events due to charged movement objects with low voltages
give a fatal electromagnetic interference in high-tech information equipment. In order to …
give a fatal electromagnetic interference in high-tech information equipment. In order to …
Experiment research of moving electrode impact on discharge parameters in narrow gap ESD
F Ruan, Y Meng, Y You, F Zhou, Z You… - International …, 2012 - ieeexplore.ieee.org
Experiment with electrostatic discharge (ESD) generator was implemented in two situations
of gap state. All discussion in previous literatures on approach speed effect in electrostatic …
of gap state. All discussion in previous literatures on approach speed effect in electrostatic …
Variations in discharge current waveforms and their power spectra injected from contact discharges of ESD‐gun with different arrangements
Y Taka, O Fujiwara - Electrical Engineering in Japan, 2012 - Wiley Online Library
Abstract The International Electrotechnical Commission (IEC) has prescribed an immunity
test (IEC61000‐4‐2) of electronic equipment against electrostatic discharges (ESDs), in …
test (IEC61000‐4‐2) of electronic equipment against electrostatic discharges (ESDs), in …