CMOS time-to-digital converters for biomedical imaging applications

R Scott, W Jiang, MJ Deen - IEEE Reviews in Biomedical …, 2021 - ieeexplore.ieee.org
Time-to-digital converters (TDCs) are high-performance mixed-signal circuits capable of
timestamping events with sub-gate delay resolution. As a result of their high-performance, in …

Integrated avalanche photodetectors for visible light

S Yanikgonul, V Leong, JR Ong, T Hu, SY Siew… - Nature …, 2021 - nature.com
Integrated photodetectors are essential components of scalable photonics platforms for
quantum and classical applications. However, most efforts in the development of such …

A first single-photon avalanche diode fabricated in standard SOI CMOS technology with a full characterization of the device

MJ Lee, P Sun, E Charbon - Optics express, 2015 - opg.optica.org
This paper reports on the first implementation of a single-photon avalanche diode (SPAD) in
standard silicon on insulator (SOI) complementary metal-oxide-semiconductor (CMOS) …

The effect of a deep virtual guard ring on the device characteristics of silicon single photon avalanche diodes

D Shin, B Park, Y Chae, I Yun - IEEE Transactions on Electron …, 2019 - ieeexplore.ieee.org
Silicon single-photon avalanche diodes (Si-SPADs) fabricated with standard CMOS
technology and providing the advantages of low noise, low cost, and compatibility with …

Area-dependent photodetection frequency response characterization of silicon avalanche photodetectors fabricated with standard CMOS technology

MJ Lee, WY Choi - IEEE Transactions on Electron Devices, 2013 - ieeexplore.ieee.org
We investigate the area-dependent characteristics of photodetection frequency responses of
850-nm silicon avalanche photodetectors (APDs) fabricated with standard complementary …

Enhanced performance of HgCdTe midwavelength infrared electron avalanche photodetectors with guard ring designs

Q Li, F Wang, P Wang, L Zhang, J He… - … on Electron Devices, 2020 - ieeexplore.ieee.org
In this article, the performance of midwavelength infrared (MWIR) HgCdTe electron
avalanche photodiodes (e-APDs) with variable annealing processes and guard ring design …

Area and Bandwidth Enhancement of an n+/p-Well Dot Avalanche Photodiode in 0.35 μm CMOS Technology

SS Kohneh Poushi, B Goll, K Schneider-Hornstein… - Sensors, 2023 - mdpi.com
This paper presents a CMOS-integrated dot avalanche photodiode (dot-APD) that features a
small central n+/p-well hemispherical cathode/p-well structure circularly surrounded by an …

Performance optimization and improvement of silicon avalanche photodetectors in standard CMOS technology

MJ Lee, WY Choi - IEEE Journal of Selected Topics in Quantum …, 2017 - ieeexplore.ieee.org
This paper discusses design optimization for silicon avalanche photodetectors (APDs)
fabricated in standard complementary metal-oxide-semiconductor (CMOS) technology in …

A near-infrared enhanced field-line crowding based CMOS-integrated avalanche photodiode

SSK Poushi, C Gasser, B Goll, M Hofbauer… - IEEE Photonics …, 2023 - ieeexplore.ieee.org
This paper presents a CMOS-integrated linear-mode avalanche photodiode based on
electric field-line crowding (EFLC-APD) to form an effective multiplication zone and a wide …

A 10-Gb/s −18.8 dBm Sensitivity 5.7 mW Fully-Integrated Optoelectronic Receiver With Avalanche Photodetector in 0.13- m CMOS

S Nayak, AH Ahmed, A Sharkia… - … on Circuits and …, 2019 - ieeexplore.ieee.org
Avalanche photodetectors (APDs) improve the sensitivity of optoelectronic (O/E) receivers
(RXs) due to their high multiplication gain and responsivity. When implemented …