Design and optimization of stress/strain in GAA nanosheet FETs for improved FOMs at sub-7 nm nodes

E Mohapatra, D Jena, S Das, CK Maiti… - Physica Scripta, 2023 - iopscience.iop.org
Stress/strain engineering techniques are employed to boost the performance of Gate-all-
around (GAA) vertically stacked nanosheet field-effect transistors (NSFETs) for 7 nm …

Performance analysis of FinFET based inverter, NAND and NOR circuits at 10 nm, 7 nm and 5 nm node technologies

A Lazzaz, K Bousbahi, M Ghamnia - Facta universitatis-series …, 2023 - doiserbia.nb.rs
Advancement in the semiconductor industry has transformed modern society. A
miniaturization of a silicon transistor is continuing following Moore's empirical law. The …

Optimization and analysis of Si/SiGe strained vertically stacked heterostructure on insulator FeFinFET for high performance analog and RF applications

K Verma, R Chaujar - Physica Scripta, 2024 - iopscience.iop.org
As semiconductor technology advances, the exploration of novel materials and device
architectures becomes imperative to meet the growing demands of integrated circuits for …

Silicon and germanium vertical super-thin body (VSTB) FET: a comparative performance overview including architectural stress-strain impact

KR Barman, S Baishya - ECS Journal of Solid State Science and …, 2022 - iopscience.iop.org
This article aims to develop a comprehensive understanding of the comparative
performance of a vertical super-thin body (VSTB) FET in terms of two device material …

A PAM-4 100 Gbps single-drive strained SiGe optical lumped Mach-Zehnder modulator for O-band application

Y Bae, SU An, T Jin, Y Kim - IEEE Journal of Quantum …, 2023 - ieeexplore.ieee.org
We propose the carrier-depletion type strained SiGe optical lumped Mach-Zehnder
modulators (MZMs) with L-shape PN junction (LSPN) with a highly CMOS-compatible …

[图书][B] Stress and strain engineering at nanoscale in semiconductor devices

CK Maiti - 2021 - books.google.com
Anticipating a limit to the continuous miniaturization (More-Moore), intense research efforts
are being made to co-integrate various functionalities (More-than-Moore) in a single chip …

Temperature characterization and performance enhancement of a 7nm finfet structure using hk materials and gaas as metal gate (mg)

MA Muqeet, TR Babu - International Journal of …, 2024 - ejournal.unimap.edu.my
The progress in semiconductor technology has played a crucial role in enhancing human
existence by introducing significant innovations. The pursuit of high-performance devices …

Atomic‐scale strain analysis for advanced Si/SiGe heterostructure by using transmission electron microscopy

L Li, R Bi, Z Dong, C Ye, J Xie, C Wang, X Li, KL Pey… - Electron, 2024 - Wiley Online Library
Three‐dimensional stacked transistors based on Si/SiGe heterojunction are a potential
candidate for future low‐power and high‐performance computing in integrated circuits …

Performance Analysis of FinFETs with Strained-Si Fin on Strain-Relaxed Buffer

J Jena, TP Dash, E Mohaptra, S Das… - 2020 IEEE VLSI …, 2020 - ieeexplore.ieee.org
The architecture of transistors has now switched from planar to the non-planar vertical
structures. The 3-D geometry of such non-planar FinFET structures imposes new challenges …

Analysis of Vertically Stacked Ferroelectric Based FinFET for Switching Applications

K Verma, R Chaujar - 2023 2nd International Conference on …, 2023 - ieeexplore.ieee.org
This paper presents the study of characteristic parameters of ferroelectric based FinFET with
vertically stacked channel engineered ferroelectric based FinFET (VSFe-FinFET) at the …