Accurate Temperature Estimation of SiC Power mosfets Under Extreme Operating Conditions

A Tsibizov, I Kovačević-Badstübner… - … on Power Electronics, 2019 - ieeexplore.ieee.org
Electrothermal modeling of silicon carbide (SiC) power devices is frequently performed to
estimate the device temperature in operation, typically assuming a constant thermal …

Circuit-based electrothermal modeling of SiC power modules with nonlinear thermal models

S Race, A Philipp, M Nagel, T Ziemann… - IEEE transactions on …, 2022 - ieeexplore.ieee.org
Silicon carbide (SiC) power devices have the potential to operate at high temperatures
beyond the capabilities of silicon power devices. At increased temperatures, the temperature …

High-voltage hybrid IGBT power modules for miniaturization of rolling stock traction inverters

X Li, D Li, G Chang, W Gong… - IEEE Transactions …, 2021 - ieeexplore.ieee.org
A type of 3.3-kV/450-A half-bridge insulated-gate bipolar transistor power module combining
the silicon (Si) and silicon carbide (SiC) technologies has been developed and reported in …

Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs

A Borghese, M Riccio, A Fayyaz… - IEEE Journal of …, 2019 - ieeexplore.ieee.org
Thanks to the increasing availability of silicon carbide (SiC) metal oxide semiconductor field
effect transistors (MOSFETs) with outstanding static and dynamic performances, the number …

Thermal imbalance among paralleling chips in power modules and the impact from traction inverter system view

X Li, Y Wang, G Chang, X Huang… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
In a high-power semiconductor power module where multiple chips are populated in
parallel, the thermal imbalance problem arises. In this article, the next-generation standard …

On-line junction temperature monitoring of switching devices with dynamic compact thermal models extracted with model order reduction

F Di Napoli, A Magnani, M Coppola, P Guerriero… - Energies, 2017 - mdpi.com
Residual lifetime estimation has gained a key point among the techniques that improve the
reliability and the efficiency of power converters. The main cause of failures are the junction …

Macro–Mesoscale Modeling of the Evolution of the Surface Roughness of the Al Metallization Layer of an IGBT Module during Power Cycling

T An, X Zheng, F Qin, Y Dai, Y Gong, P Chen - Materials, 2023 - mdpi.com
One of the main failure modes of an insulated-gate bipolar transistor (IGBT) module is the
reconstruction of an aluminum (Al) metallization layer on the surface of the IGBT chip. In this …

Highly accurate virtual dynamic characterization of discrete SiC power devices

I Kovacevic-Badstuebner, T Ziemann… - … Devices and IC's …, 2017 - ieeexplore.ieee.org
Optimized low-inductive layouting of the package interconnections and external PCBs and
bus-bars are necessary to benefit from Silicon Carbide (SiC) power devices, which allow …

Novel approach for the extraction of nonlinear compact thermal models

L Codecasa, V d'Alessandro… - … Workshop on Thermal …, 2017 - ieeexplore.ieee.org
A novel approach for extracting dynamic compact thermal models from nonlinear heat
diffusion equations, which take into account the temperature dependence of thermal …

Thermal resistance advanced calculator (TRAC)

L Codecasa, S Race, V d'Alessandro… - … Investigations of ICs …, 2018 - ieeexplore.ieee.org
A novel simulation tool, named Thermal Resistance Advanced Calculator, is presented Such
a tool allows the straightforward definition of a parametric detailed thermal model of family of …