Dynamics of the excimer laser annealing of hydrogenated amorphous silicon thin films
G Ivlev, E Gatskevich, V Chab, J Stuchlı́k… - Applied physics …, 1999 - pubs.aip.org
Time-resolved reflectivity and time-resolved conductivity spectroscopies have been used to
monitor phase changes as a function of pulse-energy density during the recrystallization of …
monitor phase changes as a function of pulse-energy density during the recrystallization of …
[PDF][PDF] Time‐resolved reflectivity technique: improvement and applications
KMA El-Kader - International Journal of Photoenergy, 1999 - Wiley Online Library
A new method for determination of the reflectivity of Si in different phase transitions during
pulsed laser irradiation is presented in this paper. This method is applied on TRR spectra of …
pulsed laser irradiation is presented in this paper. This method is applied on TRR spectra of …
The influence of preparation conditions on the photoluminescence spectra of light-emitting Si prepared by laser pulse irradiation of a-Si: H
KMA El-Kader, O Borusik, Z Chvoj, I Ulrych, J Oswald… - Thin solid films, 1996 - Elsevier
We report on room-temperature photoluminescence (PL) properties of light-emitting silicon
produced by excimer (XeCl, ArF) laser crystallization of undoped hydrogenated amorphous …
produced by excimer (XeCl, ArF) laser crystallization of undoped hydrogenated amorphous …
Infrared luminescence from spark-processed silicon
K Kim, RE Hummel - Journal of Physics and Chemistry of Solids, 2008 - Elsevier
The infrared (IR) photoluminescence (PL) emission of spark-processed silicon (sp-Si) was
investigated. A broad and strong room temperature PL peak in the 945nm (1.31 eV) spectral …
investigated. A broad and strong room temperature PL peak in the 945nm (1.31 eV) spectral …
[PDF][PDF] Electroluminescence from spark processed and other forms of silicon
J Yuan - 1999 - unsworks.unsw.edu.au
Visible electroluminescence has been achieved by spark-processing both n-type and p-type
silicon wafers. The photoluminescence (PL) is observable from heavily spark-processed …
silicon wafers. The photoluminescence (PL) is observable from heavily spark-processed …
ΝΑΝΟΔΟΜΕΣ ΠΥΡΙΤΙΟΥ ΓΙΑ ΟΠΤΟΗΛΕΚΤΡΟΝΙΚΕΣ ΕΦΑΡΜΟΓΕΣ.
Σ Γρηγορόπουλος - 1997 - didaktorika.gr
ΣΚΟΠΟΣ ΤΗΣ ΕΡΓΑΣΙΑ ΑΥΤΗΣ ΗΤΑΝ Η ΚΑΤΑΣΚΕΥΗ ΚΑΙ ΜΕΛΕΤΗ ΚΑΛΑ ΟΡΙΣΜΕΝΩΝ
ΝΑΝΟΔΟΜΩΝ ΠΥΡΙΤΙΟΥ, ΩΣΤΕ ΝΑ ΜΕΛΕΤΗΘΟΥΝ ΤΑ ΑΠΟΤΕΛΕΣΜΑΤΑ ΣΕ ΣΧΕΣΗ ΜΕ ΤΑ …
ΝΑΝΟΔΟΜΩΝ ΠΥΡΙΤΙΟΥ, ΩΣΤΕ ΝΑ ΜΕΛΕΤΗΘΟΥΝ ΤΑ ΑΠΟΤΕΛΕΣΜΑΤΑ ΣΕ ΣΧΕΣΗ ΜΕ ΤΑ …
[图书][B] Infrared luminescence from spark-processed silicon and erbium-doped spark-processed silicon
K Kim - 2005 - search.proquest.com
INFRARED LUMINESCENCE FROM SPARK-PROCESSED SILICON AND ERBIUM-DOPED
SPARK-PROCESSED SILICON By KWANGHOON KIM A DISSERTATION PRES Page 1 …
SPARK-PROCESSED SILICON By KWANGHOON KIM A DISSERTATION PRES Page 1 …
[引用][C] 1. Ulrych', M. Cernik", KMA El-Kader', P. Prikryl?, R. Cerny»
Z Chvoj, V Cháb - Diffusion and Defect Data: Solid state …, 1996 - Sci-Tech Publications