SAT-based automatic rectification and debugging of combinational circuits with LUT insertions

S Jo, T Matsumoto, M Fujita - IPSJ Transactions on System and LSI …, 2014 - jstage.jst.go.jp
Introducing partial programmability in circuits by replacing some gates with look up tables
(LUTs) can be an effective way to improve post-silicon or in-field rectification and debugging …

Partial synthesis through sampling with and without specification

M Fujita, S Jo, S Ono… - 2013 IEEE/ACM …, 2013 - ieeexplore.ieee.org
In this paper, we present techniques for partial synthesis through sampling mostly for
combinational circuits. Here partial synthesis means that most parts of the target circuits are …

Trojan circuits masking and debugging of combinational circuits with LUT insertion

A Matrosova, S Ostanin - 2018 IEEE International Conference …, 2018 - ieeexplore.ieee.org
It is extremely difficult to provide 100% correctness of fabricated high performance circuits.
Manufactured circuits may have logical and electrical bugs, Trojan Circuits (TCs) inclusions …

Masking Internal Node Faults and Trojan Circuits in Logical Circuits

A Matrosova, V Provkin… - 2019 IEEE East-West …, 2019 - ieeexplore.ieee.org
A combinational circuit C is considered. Masking of internal node logical faults with using the
subcircuit that outputs are connected with circuit C internal nodes that are fed by fault nodes …

Debugging processors with advanced features by reprogramming LUTs on FPGA

S Jo, AM Gharehbaghi, T Matsumoto… - … Conference on Field …, 2013 - ieeexplore.ieee.org
In this paper, we propose an automated method for debugging and rectification of logical
bugs in processors that are implemented on FPGAs. Our method is based on preserving the …

Automatic identification of assertions and invariants with small numbers of test vectors

M Fujita - 2015 33rd IEEE international conference on …, 2015 - ieeexplore.ieee.org
Identifying logical relationships among internal/input/output signals is one of the key
analyses for formal verification, logic synthesis, test pattern generation, and others. It is also …

[图书][B] Formal methods in computer-aided design

H Mangassarian - 2012 - search.proquest.com
The VLSI CAD flow encompasses an abundance of critical NP-complete and PSPACE-
complete problems. Instead of developing a dedicated algorithm for each, the trend during …

Better-Than-DMR Techniques for Yield Improvement

S Sanae, Y Hara-Azumi, S Yamashita… - 2014 IEEE 22nd …, 2014 - ieeexplore.ieee.org
In this work, we first study LUT optimization in PPCs for increasing their area-efficiency for
yield improvement. We focus on the fact that although 2 2n configurations are available for …

Partial Logic Synthesis via training a topologically similar binarized neural network

CJINM FUJITA - 2020 - ipsj.ixsq.nii.ac.jp
In this paper, we present a new technique and its experimental results for solving partial
logic synthesis problems through training a topologically similar binarized neural network …

Synthesizing and Completely Testing Hardware Based on Templates Through Small Numbers of Test Patterns

M Fujita - Automated Technology for Verification and Analysis …, 2016 - Springer
Here we first introduce Quantified Boolean Formula (QBF) based approaches to logic
synthesis and testing in general including automatic corrections of designs. It is formulated …