Recent advances and trends in advanced packaging
JH Lau - IEEE Transactions on Components, Packaging and …, 2022 - ieeexplore.ieee.org
In this study, advanced packaging is defined. The kinds of advanced packaging are ranked
based on their interconnect density and electrical performance, and are grouped into 2-D …
based on their interconnect density and electrical performance, and are grouped into 2-D …
Recent advances and new trends in flip chip technology
JH Lau - Journal of Electronic Packaging, 2016 - asmedigitalcollection.asme.org
Recent advances in flip chip technology such as wafer bumping, package substrate, flip chip
assembly, and underfill will be presented in this study. Emphasis is placed on the latest …
assembly, and underfill will be presented in this study. Emphasis is placed on the latest …
Recent advances and trends in fan-out wafer/panel-level packaging
JH Lau - Journal of Electronic Packaging, 2019 - asmedigitalcollection.asme.org
The recent advances and trends in fan-out wafer/panel-level packaging (FOW/PLP) are
presented in this study. Emphasis is placed on:(A) the package formations such as (a) chip …
presented in this study. Emphasis is placed on:(A) the package formations such as (a) chip …
Wafer level chip scale packaging (WL-CSP): An overview
P Garrou - IEEE Transactions on Advanced Packaging, 2000 - ieeexplore.ieee.org
Several wafer level chip scale package (WLCSP) technologies have been developed which
generate fully packaged and tested chips on the wafer prior to dicing. Many of these …
generate fully packaged and tested chips on the wafer prior to dicing. Many of these …
Design, materials, process, fabrication, and reliability of fan-out wafer-level packaging
The design, materials, process, fabrication, and reliability of fan-out wafer-level packaging
(FOWLP) with chip-first and die face-up method are investigated in this paper. Emphasis is …
(FOWLP) with chip-first and die face-up method are investigated in this paper. Emphasis is …
State of the art of lead-free solder joint reliability
JH Lau - Journal of Electronic Packaging, 2021 - asmedigitalcollection.asme.org
The state of the art of lead-free solder joint reliability is investigated in this study. Emphasis is
placed on the design for reliability (DFR) and reliability testing and data analysis. For …
placed on the design for reliability (DFR) and reliability testing and data analysis. For …
Microphone assembly with barrier to prevent contaminant infiltration
PV Loeppert, RM McCall, D Giesecke, SF Vos… - US Patent …, 2015 - Google Patents
(57) ABSTRACT A microphone assembly includes a cover, a base coupled to the cover, a
microelectromechanical system (MEMS) device disposed on the base. An opening is formed …
microelectromechanical system (MEMS) device disposed on the base. An opening is formed …
Electrical contact resistance effect on resistance spot welding
PS Wei, TH Wu - International journal of heat and mass transfer, 2012 - Elsevier
The effects of local electrical contact resistance on transport variables, cooling rate, solute
distribution, and nugget shape after solidification responsible for microstructure of the fusion …
distribution, and nugget shape after solidification responsible for microstructure of the fusion …
[图书][B] Chiplet design and heterogeneous integration packaging
JH Lau - 2023 - Springer
There are at least five different chiplet design and heterogeneous integration packaging,
namely (1) chip partition and heterogeneous integration (driven by cost and technology …
namely (1) chip partition and heterogeneous integration (driven by cost and technology …