Defect identification in semiconductors with positron annihilation:<? format?> Experiment and theory
F Tuomisto, I Makkonen - Reviews of Modern Physics, 2013 - APS
Positron annihilation spectroscopy is particularly suitable for studying vacancy-type
defects<? format?> in semiconductors. Combining state-of-the-art experimental and …
defects<? format?> in semiconductors. Combining state-of-the-art experimental and …
[图书][B] Silicon, germanium, and their alloys: growth, defects, impurities, and nanocrystals
G Kissinger, S Pizzini - 2014 - books.google.com
Despite the vast knowledge accumulated on silicon, germanium, and their alloys, these
materials still demand research, eminently in view of the improvement of knowledge on …
materials still demand research, eminently in view of the improvement of knowledge on …
Positron annihilation spectroscopy of thermally annealed hydrogenated amorphous carbon films
S Nakao, A Kinomura, K Ikeda, M Nakajima… - Vacuum, 2023 - Elsevier
Hydrogenated amorphous carbon (aC: H) films are prepared using a bipolar-type plasma-
based ion implantation and deposition system, followed by thermal annealing of the films at …
based ion implantation and deposition system, followed by thermal annealing of the films at …
Plasma and ion-beam modification of metallic biomaterials for improved anti-bacterial properties
Plasma-based technology is effective in improving the performance of titanium and
magnesium-based biomaterials with regard to bacteria prevention and osteogenetic …
magnesium-based biomaterials with regard to bacteria prevention and osteogenetic …
Implantation-induced damage in Ge: strain and disorder profiles during defect accumulation and recovery
S Decoster, A Vantomme - Journal of Physics D: Applied Physics, 2009 - iopscience.iop.org
We present an experimental study of structural lattice damage in Ge induced by ion
implantation. From the strain and disorder profiles, calculated from x-ray diffraction and ion …
implantation. From the strain and disorder profiles, calculated from x-ray diffraction and ion …
properties of intrinsic point defects in Si and Ge assessed by density functional theory
K Sueoka, E Kamiyama, P Śpiewak… - ECS Journal of Solid …, 2016 - iopscience.iop.org
During the last decade, considerable progress has been made in understanding the
properties and behavior of the vacancy V and self-interstitial I in silicon (Si) and germanium …
properties and behavior of the vacancy V and self-interstitial I in silicon (Si) and germanium …
Electrical compensation via vacancy–donor complexes in arsenic-implanted and laser-annealed germanium
Highly n-type Ge attained by shallow As implantation and excimer laser annealing was
studied with positron annihilation spectroscopy and theoretical calculations. We conclude …
studied with positron annihilation spectroscopy and theoretical calculations. We conclude …
Ion implantation defects and shallow junctions in Si and Ge
E Napolitani, G Impellizzeri - Semiconductors and Semimetals, 2015 - Elsevier
Defects produced by ion implantation in Si and Ge, their evolution upon post-implantation
annealing, and their role in shallow junction formation processes in Si and Ge are reviewed …
annealing, and their role in shallow junction formation processes in Si and Ge are reviewed …
Structural Defects and Positronium Formation in 40 keV B+-Implanted Polymethylmethacrylate
T Kavetskyy, V Tsmots, A Kinomura… - The Journal of …, 2014 - ACS Publications
Slow positron beam and optical absorption measurements are carried out to study structural
defects and positronium formation in 40 keV B+-implanted polymethylmethacrylate (B …
defects and positronium formation in 40 keV B+-implanted polymethylmethacrylate (B …
Vacancy-donor complexes in highly n-type Ge doped with As, P and Sb
Positron annihilation spectroscopy was performed to study defects in Ge doped with As, P
and Sb. In each case, the samples had approximately the same dopant concentration∼ 10 …
and Sb. In each case, the samples had approximately the same dopant concentration∼ 10 …