In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be
invaluable tools for non-destructive sample visualisation, delivering information inaccessible …

ABSTRACT A fascinating way of generating speckle patterns is by interfering the weak fields
scattered by a disordered sample with the intense trans-illuminating beam. The resulting …

摘要第四代同步辐射光源为多个研究领域提供了亮度和相干度更高, 性能更加优异的X 射线.
为了充分发挥这些光束的潜力, 需要精确的光束线装调和高质量的X 射线光学元件 …

A metrology device based on the near-field speckle technique was developed in the x-ray
test beamline at the Shanghai Synchrotron Radiation Facility to meet the at-wavelength …

As an important characterization method for beamline optics, at-wavelength metrology
technology based on wavefront measurements has been developed for many years …

In recent years, X-ray phase sensing technology has been widely used in at-wavelength
metrology and optical characterization. One of the latest developments is the technology …

Описаны принципы работы и возможности рентгеновской адаптивной и активной
оптики. Рассмотрены основные исполнительные механизмы изгиба зеркал полного …

This chapter gives an overview of the working principles, state of the art and recent
developments of X-ray speckle-based imaging to establish a background and …