Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the
surface potential on a broad range of materials. KPFM measurements require an …

The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …

The ability to sensitively detect individual charges under ambient conditions would benefit a
wide range of applications across disciplines. However, most current techniques are limited …

Measurements of the contact potential difference between different materials have been
performed for the first time using scanning force microscopy. The instrument has a high …

With much excitement and great enthusiasm I introduce this thorough treatise on the major
aspects of domain and domain wall phenomena in ferroics, mostly ferroelectrics, a major …

The theoretical concepts, experimental tools, and applications of surface photovoltage (SPV)
techniques are reviewed in detail. The theoretical discussion is divided into two sections …

Materials in which quantum mechanical effects lead to novel properties on the macroscopic
scale are of interest both fundamentally and for applications. For such quantum materials …

Abstract 2D hexagonal boron nitride (hBN) is a wide‐bandgap van der Waals crystal with a
unique combination of properties, including exceptional strength, large oxidation resistance …

In a Scanning Tunneling Microscope [1], an electronic current flows through the tunneling
barrier be-tween an atomically sharp tip and a conductive surface. Roughly speaking, the …

The Handbook of Surface and Nanometrology explains and challenges current concepts in
nanotechnology. It covers in great detail surface metrology and nanometrology and more …