Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

The accurate analysis of microscopy images representing various materials obtained in
scanning probe microscopy, scanning tunneling microscopy, and transmission electron …

Continuous advancement in nonvolatile and morphotropic beyond-Moore electronic devices
requires integration of ferroelectric and semiconductor materials. The emergence of hafnium …

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

High-performance piezoelectrics benefit transducers and sensors in a variety of
electromechanical applications. The materials with the highest piezoelectric charge …

Single-molecule imaging with atomic resolution is a notable method to study various
molecular behaviours and interactions,,,–. Although low-dose electron microscopy has been …

Abstract The Dr. Probe software for multislice simulations of STEM images is introduced, and
reference is given of the applied methods. Major program features available with the …

The enhanced compositional flexibility to incorporate multiple-principal cations in high
entropy oxides (HEOs) offers the opportunity to expand boundaries for accessible …

Relaxor ferroelectrics, which can exhibit exceptional electromechanical coupling, are some
of the most important functional materials, with applications ranging from ultrasound imaging …

Here, we present a structural study on the origin of ferroelectricity in Gd doped HfO 2 thin
films. We apply aberration corrected high-angle annular dark-field scanning transmission …