To address growing production test costs, a low-cost built-in test solution for RF circuits is
proposed that is robust to Process, Supply Voltage and Temperature variations (PVT …

This paper presents a novel and low-cost methodology for testing embedded Low Noise
Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the …

Because of aggressive technology scaling and multi-GHz operating frequencies of radio
frequency (RF) devices, parametric failure test and diagnosis of RF circuitry is becoming …

Built-in self-test (BiST) for transmitters is a desirable choice since it eliminates the reliance
on expensive instrumentation to perform radio-frequency signal analysis. Existing on-chip …

This paper presents an efficient, low-cost, built-in test (BIT) circuit for radio frequency
differential low noise amplifiers (DLNAs). The BIT circuit detects amplitude alterations at the …

This paper presents a critical step in the realization of a robust, low overhead, current-based
Built-In Self-Test (BIST) scheme for RF front-end circuits. The proposed approach involves …

This paper presents a novel technique for measuring the electrical characteristics of
analogue circuits, based on measuring the temperature at the silicon surface close to the …

Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance
on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as …

This paper presents a novel and low-cost methodology that can be used for testing RF
blocks embedded in complex SoCs. It is based on the detection and analysis of the two-tone …

We propose a technique for low-cost testing of radio-frequency components integrating
current signatures and alternate test methodology. The technique is suitable for non …