A review of thermal processing in the subsecond range: semiconductors and beyond
L Rebohle, S Prucnal, W Skorupa - Semiconductor Science and …, 2016 - iopscience.iop.org
Thermal processing in the subsecond range comprises modern, non-equilibrium annealing
techniques which allow various material modifications at the surface without affecting the …
techniques which allow various material modifications at the surface without affecting the …
Light–Material Interactions Using Laser and Flash Sources for Energy Conversion and Storage Applications
This review provides a comprehensive overview of the progress in light–material
interactions (LMIs), focusing on lasers and flash lights for energy conversion and storage …
interactions (LMIs), focusing on lasers and flash lights for energy conversion and storage …
Explosive crystallization of amorphous silicon films by flash lamp annealing
K Ohdaira, T Fujiwara, Y Endo, S Nishizaki… - Journal of Applied …, 2009 - pubs.aip.org
Explosive crystallization (EC) takes place during flash lamp annealing in micrometer-thick
amorphous Si (a-Si) films deposited on glass substrates. The EC starts from the edges of the …
amorphous Si (a-Si) films deposited on glass substrates. The EC starts from the edges of the …
Doping by flash lamp annealing
S Prucnal, L Rebohle, W Skorupa - Materials Science in Semiconductor …, 2017 - Elsevier
After a short introduction we will highlight processing issues (setup, comparison of
annealing methods, relevant requirements for annealing due to doping, diffusion, activation …
annealing methods, relevant requirements for annealing due to doping, diffusion, activation …
Atomic layer deposition thin film techniques and its bibliometric perspective
Atomic layer deposition (ALD) is known for depositing ultra-thin film materials that enable
control of composition, highly conformal film, desirable thickness, self-saturating, and …
control of composition, highly conformal film, desirable thickness, self-saturating, and …
Formation of highly uniform micrometer-order-thick polycrystalline silicon films by flash lamp annealing of amorphous silicon on glass substrates
K Ohdaira, Y Endo, T Fujiwara… - Japanese Journal of …, 2007 - iopscience.iop.org
Polycrystalline silicon (poly-Si) films as thick as 4.5 µm are prepared by flash lamp
annealing (FLA) of amorphous silicon (a-Si) films without thermal damage onto glass …
annealing (FLA) of amorphous silicon (a-Si) films without thermal damage onto glass …
Flash-lamp annealing of semiconductor materials—Applications and process models
RA McMahon, MP Smith, KA Seffen, M Voelskow… - Vacuum, 2007 - Elsevier
Flash-lamp annealing (FLA) on a millisecond time scale has been shown to be a promising
tool in the preparation of high-quality semiconducting materials. The process imposes time …
tool in the preparation of high-quality semiconducting materials. The process imposes time …
Heavily Ga-doped germanium layers produced by ion implantation and flash lamp annealing: Structure and electrical activation
V Heera, A Mücklich, M Posselt, M Voelskow… - Journal of Applied …, 2010 - pubs.aip.org
Heavily p-type doped Ge layers were fabricated by 100 keV Ga implantation and
subsequent flash lamp annealing for 3 ms in the temperature range between 700 and 900 …
subsequent flash lamp annealing for 3 ms in the temperature range between 700 and 900 …
Millisecond thermal processing using flash lamps for the advancement of thin layers and functional coatings
W Skorupa, T Schumann, L Rebohle - Surface and Coatings Technology, 2017 - Elsevier
Thermal processing in the millisecond range provides advanced, non-equilibrium annealing
techniques which allow dedicated material modifications at the surface without affecting the …
techniques which allow dedicated material modifications at the surface without affecting the …
Flash-lamp-induced explosive crystallization of amorphous germanium films leaving behind periodic microstructures
K Ohdaira, H Matsumura - Thin Solid Films, 2012 - Elsevier
Flash lamp annealing (FLA) can induce the explosive crystallization (EC) of micrometer-
order-thick amorphous germanium (a-Ge) films. This EC leaves behind periodic …
order-thick amorphous germanium (a-Ge) films. This EC leaves behind periodic …