Assessing, controlling and understanding parameter variations of SiC power MOSFETs in switching operation

T Aichinger, MW Feil, P Salmen - Key Engineering Materials, 2023 - Trans Tech Publ
Semiconductor manufacturers and researchers have recently revealed that under specific
bipolar gate switching conditions SiC MOSFETs exhibit parameter drift dynamics different …

Temperature-dependent electroluminescence of a gate pulsed silicon carbide metal–oxide–semiconductor field-effect transistor: Insight into interface traps

M Weger, MW Feil, M Van Orden, J Cottom… - Journal of Applied …, 2023 - pubs.aip.org
Switching a silicon carbide (SiC) metal–oxide–semiconductor field-effect transistor between
inversion and accumulation with removed drain and grounded source terminals leads to …

Time-gated optical spectroscopy of field-effect-stimulated recombination via interfacial point defects in fully processed silicon carbide power MOSFETs

MW Feil, M Weger, H Reisinger, T Aichinger… - Physical Review …, 2024 - APS
Fully processed SiC power MOSFETs emit light during switching of the gate terminal, while
the drain and source terminals are both grounded. The emitted photons are caused by …