Solar energy absorption mediated by surface plasma polaritons in spectrally selective dielectric-metal-dielectric coatings: a critical review
The effective use of solar energy has become significantly important due to unnatural
weather changes and fossil fuel exhaustion. Concentrating Solar Power (CSP) technology is …
weather changes and fossil fuel exhaustion. Concentrating Solar Power (CSP) technology is …
A study on structural, optical and hydrophobic properties of oblique angle sputter deposited HfO2 films
HfO 2 thin films have been synthesized by oblique angle reactive DC magnetron sputtering
technique. Present study reports the effect of deposition angle on the hydrophobic …
technique. Present study reports the effect of deposition angle on the hydrophobic …
Total Ionization Dose Effects on Charge-Trapping Memory With Al2O3/HfO2/Al2O3 Trilayer Structure
This paper investigates total ionization dose (TID) effects on the electrical characteristics of
Al 2 O 3/HfO 2/Al 2 O 3-based charge trapping memory (CTM) devices by 10-keV X-ray. The …
Al 2 O 3/HfO 2/Al 2 O 3-based charge trapping memory (CTM) devices by 10-keV X-ray. The …
Synergic Impacts of CF4 Plasma Treatment and Post-thermal Annealing on the Nonvolatile Memory Performance of Charge-Trap-Assisted Memory Thin-Film Transistors Using …
JJ Kim, SM Yoon - ACS Applied Electronic Materials, 2022 - ACS Publications
Charge-trap-assisted memory thin-film transistors (CTM-TFTs) using the engineered Al-
doped HfO2 (Al: HfO2) CTL and In–Ga–Zn–O channel were fabricated and characterized to …
doped HfO2 (Al: HfO2) CTL and In–Ga–Zn–O channel were fabricated and characterized to …
Charge-Trapping-Type Flash Memory Device With Stacked High- Charge-Trapping Layer
PH Tsai, KS Chang-Liao, TC Liu… - IEEE electron device …, 2009 - ieeexplore.ieee.org
Operating properties of charge-trapping-type Flash memory devices with single or stacked
structures on trapping layer are investigated in this letter. Improved operation and reliability …
structures on trapping layer are investigated in this letter. Improved operation and reliability …
The Reliability Impact of Bi Doping on the HfO2 Charge-Trapping Layer: A First-Principles Study
F Ye, Y Zhu, JH Yuan, J Wang - Journal of Electronic Materials, 2024 - Springer
Hafnia has emerged as a promising material for charge-trapping memory. However,
enhancing its trapping performance remains a significant research challenge. In this work …
enhancing its trapping performance remains a significant research challenge. In this work …
Charge Trapping in amorphous dielectrics for secure charge storage
The fundamental scientific ingredient in the current information society is charge trapping in
dielectric materials. The current data storage device known as NAND flash is based on …
dielectric materials. The current data storage device known as NAND flash is based on …
High-κ HfO2 nanocrystal memory capacitors prepared by phase separation of atomic-layer-deposited HfO2∕ Al2O3 nanomixtures
Physical and electrical characteristics of atomic-layer-deposited high-κ nanocrystals in a at
elevated temperature have been investigated. Because the phase separation of high-κ …
elevated temperature have been investigated. Because the phase separation of high-κ …
Charge Trapping Memory Characteristics of p-Si/Ultrathin Al2O3∕(HfO2) 0.8 (Al2O3) 0.2∕ Al2O3/Metal Multilayer Structure
Z Tang, Y Xia, H Xu, J Yin, Z Liu, A Li… - … and Solid-State …, 2010 - iopscience.iop.org
Memory properties of p-Si/ultrathin/metal capacitors have been investigated, in which all the
high-dielectric films were derived by atomic layer deposition technique. Using a film as the …
high-dielectric films were derived by atomic layer deposition technique. Using a film as the …
Progress of high-k dielectrics applicable to SONOS-type nonvolatile semiconductor memories
Z Tang, Z Liu, X Zhu - Transactions on Electrical and Electronic …, 2010 - koreascience.kr
As a promising candidate to replace the conventional floating gate flash memories,
polysilicon-oxide-nitride-oxidesilicon (SONOS)-type nonvolatile semiconductor memories …
polysilicon-oxide-nitride-oxidesilicon (SONOS)-type nonvolatile semiconductor memories …