X-ray scattering is a structural characterization tool that has impacted diverse fields of study.
It is unique in its ability to examine materials in real time and under realistic sample …

Organic semiconductors offer the potential for large-area deposition on substrates of flexible
or unique form factors and can be deposited at ambient conditions at low cost. They can be …

Light-emitting diodes (LEDs) are ubiquitous in modern society, with applications spanning
from lighting and displays to medical diagnostics and data communications. Metal-halide …

GIXSGUI is a MATLAB toolbox that offers both a graphical user interface and script-based
access to visualize and process grazing-incidence X-ray scattering data from nanostructures …

Grazing incidence X‐ray scattering (GIXS) provides unique insights into the morphology of
active materials and thin film layers used in organic photovoltaic devices. With grazing …

The frequency of reports utilizing synchrotron‐based grazing incident wide angle X‐ray
scattering (GIWAXS) to study metal halide perovskite thin films has exploded recently, as this …

Solar cells based on organic–inorganic hybrid perovskite materials have emerged as the
most efficient next-generation thin-film solar cells within just a decade of research and show …

Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite
size effects in X-ray scattering. Various aspects of Scherrer-type grain-size analysis are …

Grazing incidence X‐ray scattering (GIXS) is used to characterize the morphology of poly (3‐
hexylthiophene)(P3HT)–phenyl‐C61‐butyric acid methyl ester (PCBM) thin film bulk …

The complex nano-morphology of modern soft-matter materials is successfully probed with
advanced grazing-incidence techniques. Based on grazing-incidence small-and wide-angle …