A molecular dynamics study on thermal and rheological properties of BNNS-epoxy nanocomposites

Z Liu, J Li, C Zhou, W Zhu - International Journal of Heat and Mass Transfer, 2018 - Elsevier
Epoxy resin as the underfill material were widely used in microelectronic packaging, and the
heat transfer performance has become an important factor affecting IC integration …

Copper wire bonding: A review

H Zhou, A Chang, J Fan, J Cao, B An, J Xia, J Yao… - Micromachines, 2023 - mdpi.com
This paper provides a comprehensive review on copper (Cu) wire bonding. Firstly, it
introduces the common types of Cu wire available in the market, including bare Cu wire …

A novel high-speed jet dispenser driven by double piezoelectric stacks

C Zhou, J Duan, G Deng, J Li - IEEE Transactions on Industrial …, 2016 - ieeexplore.ieee.org
A novel bi-piezoelectric jet dispenser with a zoom mechanism is proposed to distribute
adhesives rapidly. The work frequency of the new jet dispenser can reach 500 Hz. The …

The thermal cycling reliability of copper pillar solder bump in flip chip via thermal compression bonding

J Li, Y Zhang, H Zhang, Z Chen, C Zhou, X Liu… - Microelectronics …, 2020 - Elsevier
In this paper, the thermal-mechanical reliability of flip chip on board (FCOB) with copper
pillar solder joint is investigated. By increasing the temperature and time of the thermal …

Microstructural evaluation of interfacial intermetallic compounds in Cu wire bonding with Al and Au pads

HG Kim, SM Kim, JY Lee, MR Choi, SH Choe, KH Kim… - Acta Materialia, 2014 - Elsevier
A comparative study on the difference in interfacial behavior of thermally aged Cu wire
bonding with Al and Au pads was conducted using transmission electron microscopy …

The Ʃ3 twin dependence of thermo-mechanical fatigue of a polycrystalline high-purity Cu film

D Kim, C Choe, C Chen, S Lee, SJ Lee, S Park… - International Journal of …, 2021 - Elsevier
This study conducts stress-controlled cyclic tension-tension tests from room temperature
(RT) to 200° C, at 50° C intervals, on high-purity Cu films to comprehensively understand the …

Cu-Al interfacial formation and kinetic growth behavior during HTS reliability test

CP Liu, SJ Chang, YF Liu, WS Chen - Journal of Materials Processing …, 2019 - Elsevier
Reverse engineering techniques of Cu wire bonding process used in manufacturing
microelectronic packing components are proposed for evaluating Cu-Al intermetallic …

Corrosion-induced degradation and its mechanism study of Cu–Al interface for Cu-wire bonding under HAST conditions

CP Liu, SJ Chang, YF Liu, J Su - Journal of Alloys and Compounds, 2020 - Elsevier
This study explores the Cu wire corrosion-related issues and provides solutions for
evaluation & analysis as the Automotive Electronics Council (AEC) continually formulates …

Direct-acting piezoelectric jet dispenser with rhombic mechanical amplifier

C Zhou, J Li, JA Duan, G Deng - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In order to tackle jet motion interference between a needle and guiding part, a new
piezoelectric jet dispenser based on the rhombus magnifying principle is proposed. The new …

[HTML][HTML] Influence of Pd-Layer Thickness on Bonding Reliability of Pd-Coated Cu Wire

J Fan, D Yuan, J Du, T Hou, F Wang, J Cao, X Yang… - Micromachines, 2024 - mdpi.com
In this paper, three Pd-coated Cu (PCC) wires with different Pd-layer thicknesses were used
to make bonding samples, and the influence of Pd-layer thickness on the reliability of …