Electronic technologies that can operate in harsh radiation environments are important in
space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated …

New requirements on post-accident monitoring systems in nuclear power plants pose fresh
challenges for electronic system designers and nuclear power plant personnel, in particular …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

We present a resilience analysis framework, called FIdelity, to accurately and quickly
analyze the behavior of hardware errors in deep learning accelerators. Our framework …

Convolutional neural networks (CNNs) are becoming attractive alternatives to traditional
image-processing algorithms in self-driving vehicles for automotive, military, and aerospace …

A single-event transient (SET) due to alpha particle strike is studied in 11-and 6-nm-bulk
FinFETs and 6-nm-bulk nanosheet FET using 3-D TCAD simulation. The nanosheet device …

Since the introduction of fast integrated circuits, semiconductor manufacturers have
concentrated their efforts on reducing the size of transistors. Increased working frequencies …

A set of upset criteria based on circuit characteristic switching time frame is developed and
used to bridge transistor-level TCAD simulations to circuit-level single-event (SE) upset …

This work describes a comparative radiation reliability analysis between two reconfigurable
devices with different manufacturing technology: 28 nm CMOS-based and 16 nm FinFET …

In this paper, we compare how radiation-induced soft errors affect the execution results of
user-level applications on different processor cores that implement the same instruction set …