The current status and future prospects of non‐contact atomic force microscopy (nc‐AFM)
and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin …

We present an overview of the main techniques for production and processing of graphene
and related materials (GRMs), as well as the key characterization procedures. We adopt …

Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological
functionalities are directly coupled to electrical processes and ionic dynamics at solid–liquid …

Kelvin probe force microscopy is a scanning probe technique capable of mapping the local
surface potential or work function on various surfaces with high spatial resolution. This …

Seven years have passed since the first volume “Kelvin probe force microscopy—Measuring
and compensating electrostatic forces” has been published in 2011. It presented the first …

The work function difference between single layer and bilayer graphene grown epitaxially
on 6 H-SiC (0001) has been determined to be 135±9 meV by means of the Kelvin probe …

We present dynamic force-microscopy experiments and first-principles simulations that
contribute to clarify the origin of atomic-scale contrast in Kelvin-probe force-microscopy …

Chalcogenide phase change materials reversibly switch between non-volatile states with
vastly different optical properties, enabling novel active nanophotonic devices. However, a …

From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic
force microscopy we study atomic-scale variations in the electronic surface potential on TiO …

Extreme near-field heat transfer between metallic surfaces is a subject of debate as the state-
of-the-art theory and experiments are in disagreement on the energy carriers driving heat …