Ion beams in materials processing and analysis

B Schmidt, K Wetzig - 2012 - books.google.com
A comprehensive review of ion beam application in modern materials research is provided,
including the basics of ion beam physics and technology. The physics of ion-solid …

A review of thermal processing in the subsecond range: semiconductors and beyond

L Rebohle, S Prucnal, W Skorupa - Semiconductor Science and …, 2016 - iopscience.iop.org
Thermal processing in the subsecond range comprises modern, non-equilibrium annealing
techniques which allow various material modifications at the surface without affecting the …

Novel Ge waveguide platform on Ge-on-insulator wafer for mid-infrared photonic integrated circuits

J Kang, M Takenaka, S Takagi - Optics express, 2016 - opg.optica.org
We present Ge rib waveguide devices fabricated on a Ge-on-insulator (GeOI) wafer as a
proof-of-concept Ge mid-infrared photonics platform. Numerical analysis revealed that the …

III–V/Ge channel MOS device technologies in nano CMOS era

S Takagi, R Zhang, J Suh, SH Kim… - Japanese Journal of …, 2015 - iopscience.iop.org
CMOS utilizing high-mobility III–V/Ge channels on Si substrates is expected to be one of the
promising devices for high-performance and low power advanced LSIs in the future …

Brother silicon, sister germanium

J Vanhellemont, E Simoen - journal of the electrochemical …, 2007 - iopscience.iop.org
Material and lattice defect properties of silicon and germanium relevant for device
processing are discussed and compared with respect to their impact on crystal pulling …

Trends in semiconductor defect engineering at the nanoscale

EG Seebauer, KW Noh - Materials Science and Engineering: R: Reports, 2010 - Elsevier
Defect engineering involves manipulating the type, concentration, spatial distribution, or
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …

Diffusion and defect reactions between donors, C, and vacancies in Ge. I. Experimental results

S Brotzmann, H Bracht, JL Hansen, AN Larsen… - Physical Review B …, 2008 - APS
The diffusion of self-atoms and n-type dopants such as phosphorus, arsenic, and antimony
in germanium was studied by means of isotopically controlled multilayer structures doped …

[HTML][HTML] Germanium monolayer doping: successes and challenges for the next generation Ge devices

F Sgarbossa - Materials Science in Semiconductor Processing, 2023 - Elsevier
The growing interest in nanoelectronics and photonics, combined with the development of
new germanium-based devices, provide the impetus to develop new doping methods …

Doping by flash lamp annealing

S Prucnal, L Rebohle, W Skorupa - Materials Science in Semiconductor …, 2017 - Elsevier
After a short introduction we will highlight processing issues (setup, comparison of
annealing methods, relevant requirements for annealing due to doping, diffusion, activation …

Atomistic simulation of amorphous germanium and its solid phase epitaxial recrystallization

M Posselt, A Gabriel - Physical Review B—Condensed Matter and Materials …, 2009 - APS
Amorphous Ge and its recrystallization are investigated by molecular-dynamics simulations
using a Stillinger-Weber-type interatomic potential. Unlike previously used parametrizations …