Electronic noise—From advanced materials to quantum technologies

AA Balandin, E Paladino, PJ Hakonen - Applied Physics Letters, 2024 - pubs.aip.org
The science of electronic fluctuations and noise has been one of the most important
branches of applied physics. The investigation of noise is essential for the understanding of …

Exploring Disturb Characteristics in 2D and 3D Ferroelectric NAND Memory Arrays for Next-Generation Memory Technology

IJ Kim, J Choi, JS Lee - ACS Applied Materials & Interfaces, 2024 - ACS Publications
Ferroelectric transistors are considered promising for next-generation 3D NAND technology
due to their lower power consumption and faster operation compared to conventional …

Ferroelectric transistor with grooved structure for reliable multi-level characteristics

IJ Kim, JS Lee - IEEE Electron Device Letters, 2023 - ieeexplore.ieee.org
Ferroelectric transistors that use hafnia-based ferroelectric materials are considered as a
promising candidate for next-generation memory devices due to their fast operation speed …

The identification of traps in HfO2-based FeFET with SiON as an interlayer using current transient method

L Zhou, J Cui, X Wang, F Tian, H Zhu… - Semiconductor …, 2024 - iopscience.iop.org
This work investigates the current transient and trap characteristics of Si FeFET with HfZrO
ferroelectric and SiON as the interfacial layer. The trap characteristics in the …

Crystal Filter-Mediated Grain Alignment in Poly-Si Thin-Film Transistors for Next-Generation Ferroelectric Memory Devices

IJ Kim, J Choi, JS Lee - IEEE Electron Device Letters, 2024 - ieeexplore.ieee.org
Hafnia-based ferroelectric thin-film transistors (FeTFTs) hold promise for next-generation
memory applications like three-dimensional (3D) NAND flash memory, owing to their low …