On the Characteristics of Helical 3D X-Ray Dark-Field Imaging

L Felsner, S Hu, V Ludwig, G Anton, A Maier… - … 17. bis 19. März 2019 in …, 2019 - Springer
The X-ray dark-field can be measured with a grating interferometer. For oriented structures
like fibers, the signal magnitude depends on the relative orientation between fiber and …