Titanium dioxide thin films by atomic layer deposition: A review
JP Niemelä, G Marin, M Karppinen - Semiconductor science and …, 2017 - iopscience.iop.org
Within its rich phase diagram titanium dioxide is a truly multifunctional material with a
property palette that has been shown to span from dielectric to transparent-conducting …
property palette that has been shown to span from dielectric to transparent-conducting …
Precursor design and reaction mechanisms for the atomic layer deposition of metal films
KB Ramos, MJ Saly, YJ Chabal - Coordination chemistry reviews, 2013 - Elsevier
Deposition of thin films with desired compositions, conformality and bonding to substrates is
a key component in nanotechnology research. The growth of metal films by atomic layer …
a key component in nanotechnology research. The growth of metal films by atomic layer …
Atomic layer deposition of noble metals and their oxides
J Hämäläinen, M Ritala, M Leskelä - Chemistry of Materials, 2014 - ACS Publications
Atomic layer deposition (ALD) is an attractive method to deposit thin films for advanced
technological applications such as microelectronics and nanotechnology. One material …
technological applications such as microelectronics and nanotechnology. One material …
Nickel bis diazabutadiene precursors, their synthesis, and their use for nickel containing films depositions
C Lansalot-Matras, J Gatineau, BJ Jurcik Jr - US Patent 9,206,507, 2015 - Google Patents
Disclosed are homoleptic diazabutadiene nickel precursors used for the vapor deposition of
nickel-containing films. The precursors have the general formula Ni (R-DAD) 2, wherein R …
nickel-containing films. The precursors have the general formula Ni (R-DAD) 2, wherein R …
Volatile dihydropyrazinly and dihydropyrazine metal complexes
JAT Norman, SV Ivanov, X Lei - US Patent 9,994,954, 2018 - Google Patents
A composition comprising dihydropyrazinyl anions that can be coordinated as 6 electron
ligands to a broad range of different metals to yield volatile metal complexes for ALD and …
ligands to a broad range of different metals to yield volatile metal complexes for ALD and …
Atomic layer deposition of Ru for replacing Cu-interconnects
Y Kotsugi, SM Han, YH Kim, T Cheon… - Chemistry of …, 2021 - ACS Publications
The atomic layer deposition (ALD) of Ru using a metal–organic precursor, tricarbonyl
(trimethylenemethane) ruthenium [Ru (TMM)(CO) 3] and O2 as a reactant is reported. The …
(trimethylenemethane) ruthenium [Ru (TMM)(CO) 3] and O2 as a reactant is reported. The …
Atomic layer deposition of ruthenium and ruthenium oxide using a zero-oxidation state precursor
DZ Austin, MA Jenkins, D Allman, S Hose… - Chemistry of …, 2017 - ACS Publications
Atomic layer deposition (ALD) processes are reported for ruthenium (Ru) and ruthenium
oxide (RuO2) using a zero-oxidation state liquid precursor, η4-2, 3-dimethylbutadiene …
oxide (RuO2) using a zero-oxidation state liquid precursor, η4-2, 3-dimethylbutadiene …
Metal ALD and pulsed CVD: Fundamental reactions and links with solution chemistry
DJH Emslie, P Chadha, JS Price - Coordination Chemistry Reviews, 2013 - Elsevier
Atomic layer deposition (ALD) is a thin film deposition technique which operates via
repeated alternating and self-terminating surface-based reactions between a precursor and …
repeated alternating and self-terminating surface-based reactions between a precursor and …
Nucleation Enhancement and Area-Selective Atomic Layer Deposition of Ruthenium Using RuO4 and H2 Gas
MM Minjauw, H Rijckaert, IV Driessche… - Chemistry of …, 2019 - ACS Publications
Inherent substrate selectivity is reported for the thermal RuO4 (ToRuS)/H2 gas atomic layer
deposition (ALD) process on H-terminated Si (Si–H) versus SiO2. In situ spectroscopic …
deposition (ALD) process on H-terminated Si (Si–H) versus SiO2. In situ spectroscopic …
Atomic layer deposition of ruthenium (Ru) thin films using ethylbenzen-cyclohexadiene Ru (0) as a seed layer for copper metallization
S Yeo, SH Choi, JY Park, SH Kim, T Cheon, BY Lim… - Thin Solid Films, 2013 - Elsevier
Ruthenium (Ru) thin films were grown on thermally-grown SiO 2 substrates using atomic
layer deposition (ALD) by a sequential supply of (ethylbenzene)(1, 3-cyclohexadiene) Ru …
layer deposition (ALD) by a sequential supply of (ethylbenzene)(1, 3-cyclohexadiene) Ru …