Characterization and optimization of junctionless gate-all-around vertically stacked nanowire FETs for sub-5 nm technology nodes

VB Sreenivasulu, V Narendar - Microelectronics Journal, 2021 - Elsevier
In this paper, for the first time, we have investigated the DC, analog/RF, and linearity metrics
of asymmetric spacer junctionless (JL) Gate-All-Around (GAA) vertically stacked nanowire …

Vertically-grown TFETs: an extensive analysis

AS Geege, TSA Samuel - Silicon, 2023 - Springer
TFET is an exciting device for ultra-low and low power implementations since it improves
electrical performance while also providing steeper switching ratio. This study encloses with …

[HTML][HTML] Real-time prediction of mechanical behaviors of underwater shield tunnel structure using machine learning method based on structural health monitoring data

X Tan, W Chen, T Zou, J Yang, B Du - Journal of Rock Mechanics and …, 2023 - Elsevier
Predicting the mechanical behaviors of structure and perceiving the anomalies in advance
are essential to ensuring the safe operation of infrastructures in the long run. In addition to …

Investigating the effects of doping gradient, trap charges, and temperature on Ge vertical TFET for low power switching and analog applications

VK Chappa, AK Yadav, A Deka, R Khosla - Materials Science and …, 2024 - Elsevier
Influence of Gaussian doping in transistor regions, doping gradient step size (σ), interface
trap charges (ITC), and temperature on DC, Analog, and Linearity performance of Ge …

Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET

R Saha, R Goswami, DK Panda - Microelectronics Journal, 2022 - Elsevier
In this paper, the electrical parameters are evaluated for the variations of temperature in
Gate Overlap Ge source Step Shape Double Gate TFET (GO-Ge-SSDG-TFET) under the …

Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations

KK Nigam, Dharmender, VA Tikkiwal… - Journal of Circuits …, 2023 - World Scientific
In this paper, the performance of dual-material stacked gate oxide-source dielectric pocket-
tunnel field-effect transistor (DMSGO-SDP-TFET) has been investigated by considering fixed …

Gate-all-around junctionless FET based label-free dielectric/charge modulation detection of SARS-CoV-2 virus

KN Priyadarshani, S Singh, MKA Mohammed - RSC advances, 2022 - pubs.rsc.org
The recent corona outbreak has necessitated the development of a label-free, highly
sensitive, fast, accurate, and cost-effective biosensor for the detection of SARS-CoV-2 virus …

Ultra Sensitive Label-Free Detection of Biomolecules Using Vertically Extended Drain Double Gate Si₀.₅Ge₀.₅ Source Tunnel FET

KN Priyadarshani, S Singh - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
This work reports a vertically extended drain double gate Si 0.5 Ge 0.5 source tunnel FET for
the biomolecules detection using its electrical properties modulation in presence of …

Impact of interface trap charge and temperature on the performance of epitaxial layer tunnel field effect transistor

RG Debnath, S Baishya - Microelectronics Journal, 2022 - Elsevier
A simulation study of the impact of interface traps on the performance of the Epitaxial Layer
Tunnel Field Effect Transistor (ETLTFET) having Si (1-x) Ge x as source material is …

Analysis of nanoscale digital circuits using novel drain-gate underlap DMG hetero-dielectric TFET

D Gracia, D Nirmal, DJ Moni - Microelectronics Journal, 2022 - Elsevier
In this paper, the investigation of dual metal double gate (DMG) hetero-dielectric TFET with
drain-gate underlap for nanoscale digital applications is analyzed. Drain-gate underlap …