Abstract All-Programmable System-on-Chips (APSoCs) constitute a compelling option for
employing applications in radiation environments thanks to their high-performance …

Because of its excellent small sample learning abilities and simple network structure,
support vector machine (SVM) is widely applied in various pattern recognition fields, eg, face …

Radiation-induced single transient faults (STFs) are expected to evolve into multiple
transient faults (MTFs) at nanoscale CMOS technology nodes. For this reason, the reliability …

Traditionally, increasing logical masking probability has been used to improve the circuit
reliability against single-event transients (SETs). As the very first work, this paper presents a …

As the feature size of integrated circuits decreases to the nanometer scale, process
fluctuations, aging effects, and particle radiation have an increasing influence on the Failure …

Cosmic radiation resulting in transient faults to the combinational logic of Integrated Circuits
(ICs), constitutes a major reliability concern for space applications. In addition, continuous …

As the feature size of integrated circuits (ICs) continues to shrink, radiation-induced multiple
bit upsets (MBUs) become more frequent than single bit upsets (SBUs) in nanometer ICs …

The transistor simulation tools (eg TCAD and SPICE) are widely used to simulate single
event effects (SEE) in industry. However, due to the variances of the physical parameters in …

Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern.
The continuous downscaling of device feature size and the reduction in supply voltage in …

As embedded processors become powerful, a growing number of embedded systems
equipped with artificial intelligence (AI) algorithms have been used in radiation …